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Volumn 14, Issue 3, 2002, Pages 210-212
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Measurement of the anisotropic refractive indices of spin cast thin poly(2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenyl-enevinylene) (MEH-PPV) films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
ELECTRIC FIELD EFFECTS;
ELECTRON TRANSITIONS;
ELLIPSOMETRY;
LIGHT POLARIZATION;
LIGHT REFLECTION;
LIGHT TRANSMISSION;
MAGNETIC MOMENTS;
MATHEMATICAL MODELS;
OPTICAL CORRELATION;
PERMITTIVITY;
POLYOLEFINS;
REFRACTIVE INDEX;
SILICON WAFERS;
SPECTROSCOPIC ANALYSIS;
POLYMER FILMS;
VARIABLE ANGLE SPECTROSCOPIC ELLIPSOMETRY (VASE);
THIN FILMS;
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EID: 0037022411
PISSN: 09359648
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-4095(20020205)14:3<210::AID-ADMA210>3.0.CO;2-2 Document Type: Article |
Times cited : (122)
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References (13)
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