Lamination method for the study of interfaces in polymeric thin film transistors

Journal of the American Chemical Society

Volumn 126, Issue 43, 2004, Pages 13928-13929

  Chabinyc, Michael L ^a   Salleo, Alberto ^a   Wu, Yiliang ^b   Liu, Ping ^b   Ong, Beng S ^b   Heeney, Martin ^c   McCulloch, Iain ^c  

^a PALO ALTO RESEARCH CENTER   (United States)

^b XEROX RESEARCH CENTRE OF CANADA   (Canada)

^c Merck Chemicals   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DIMETICONE; POLYMER; SILICON;

ARTICLE; ELECTRIC CONDUCTIVITY; FILM; HYDROPHILICITY; ROOM TEMPERATURE; SEMICONDUCTOR; STRUCTURE ANALYSIS;

EID: 7444271014     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja044884o     Document Type: Article

References (12)

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