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Applied Physics A: Materials Science and Processing

Volumn 75, Issue 4, 2002, Pages 501-506

Optical constants of 3,4,9,10-perylenetetracarboxylic dianhydride films on silicon and gallium arsenide studied by spectroscopic ellipsometry

(6) Friedrich, M a Wagner, Th b Salvan, G a Park, S a Kampen, T U a Zahn, D R T a

a CHEMNITZ UNIVERSITY OF TECHNOLOGY (Germany)

b LOT Oriel GmbH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELLIPSOMETRY; INFRARED SPECTROSCOPY; MOLECULAR BEAMS; MOLECULAR STRUCTURE; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ORGANIC COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES;

ATTENUATED TOTAL REFLECTION SPECTROSCOPY; FILM STRUCTURE; OPTICAL ANISOTROPY; OPTICAL CONSTANTS; PERYLENETETRACARBOXYLIC DIANHYDRIDE FILMS; POLYCRYSTALLINE FILMS;

THIN FILMS;

EID: 0036778660 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390101001 Document Type: Article

Times cited : (27)

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