Substrate-dependent interface composition and charge transport in films for organic photovoltaics

Applied Physics Letters

Volumn 94, Issue 23, 2009, Pages

  Germack, David S ^a   Chan, Calvin K ^b   Hamadani, Behrang H ^b   Richter, Lee J ^b   Fischer, Daniel A ^a   Gundlach, David J ^b   Delongchamp, Dean M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MOBILITY; BURIED INTERFACE; CHARGE TRANSPORT; DEVICE DESIGN; INTERFACE COMPOSITION; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ORGANIC PHOTOVOLTAICS; POLYMER-FULLERENE; SURFACE ENERGIES;

FULLERENES; PHOTOVOLTAIC EFFECTS; POLYMER BLENDS; SURFACE CHEMISTRY; SURFACE TENSION; THIN FILM TRANSISTORS; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 67649109140     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3149706     Document Type: Article

References (24)

1. A. C. Mayer, S. R. Scully, B. E. Hardin, M. W. Rowell, and M. D. McGehee, Mater. Today 1369-7021 10, 28 (2007). 10.1016/S1369-7021(07)70276-6
2. M. Jorgensen, K. Norrman, and F. C. Krebs, Sol. Energy Mater. Sol. Cells 0927-0248 92, 686 (2008). 10.1016/j.solmat.2008.01.005
3. M. Koppe, M. Scharber, C. Brabec, W. Duffy, M. Heeney, and I. McCulloch, Adv. Funct. Mater. 1616-301X 17, 1371 (2007). 10.1002/adfm.200600859
4. C. Yang, J. Y. Kim, S. Cho, J. K. Lee, A. J. Heeger, and F. Wudl, J. Am. Chem. Soc. 0002-7863 130, 6444 (2008). 10.1021/ja710621j
5. H. Hoppe and N. S. Sariciftci, J. Mater. Chem. 0959-9428 16, 45 (2006). 10.1039/b510618b
6. J. Stöhr, NEXAFS Spectroscopy (Springer, Berlin, 1992).
7. R. J. Kline, D. M. DeLongchamp, D. A. Fischer, E. K. Lin, M. Heeney, I. McCulloch, and M. F. Toney, Appl. Phys. Lett. 0003-6951 90, 062117 (2007). 10.1063/1.2472533
8. G. Li, Y. Yao, H. Yang, V. Shrotriya, G. Yang, and Y. Yang, Adv. Funct. Mater. 1616-301X 17, 1636 (2007). 10.1002/adfm.200600624
9. Certain commercial equipment, instruments, or materials are identified in this paper to foster understanding. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials or equipment identified are necessarily the best one available for this purpose.
10. D. H. K. Pan and W. M. Prest, J. Appl. Phys. 0021-8979 58, 2861 (1985). 10.1063/1.335858
11. R. D. Peters, X. M. Yang, T. K. Kim, B. H. Sohn, and P. F. Nealey, Langmuir 0743-7463 16, 4625 (2000). 10.1021/la991500c
12. X. J. Wang, T. Ederth, and O. Inganas, Langmuir 0743-7463 22, 9287 (2006). 10.1021/la061606p
13. M. L. Chabinyc, A. Salleo, Y. L. Wu, P. Liu, B. S. Ong, M. Heeney, and I. McCulloch, J. Am. Chem. Soc. 0002-7863 126, 13928 (2004). 10.1021/ja044884o
14. D. M. DeLongchamp, R. J. Kline, E. K. Lin, D. A. Fischer, L. J. Richter, L. A. Lucas, M. Heeney, I. McCulloch, and J. E. Northrup, Adv. Mater. (Weinheim, Ger.) 0935-9648 19, 833 (2007). 10.1002/adma.200602651
15. G. Horowitz, J. Mater. Res. 0884-2914 19, 1946 (2004). 10.1557/JMR.2004.0266
16. D. M. DeLongchamp, B. M. Vogel, Y. Jung, M. C. Gurau, C. A. Richter, O. A. Kirillov, J. Obrzut, D. A. Fischer, S. Sambasivan, L. J. Richter, and E. K. Lin, Chem. Mater. 0897-4756 17, 5610 (2005). 10.1021/cm0513637
17. L. Y. Park, A. M. Munro, and D. S. Ginger, J. Am. Chem. Soc. 0002-7863 130, 15916 (2008). 10.1021/ja804088j
18. S. K. Hau, H. -L. Yip, O. Acton, N. S. Baek, H. Ma, and A. K.-Y. Jen, J. Mater. Chem. 0959-9428 18, 5113 (2008). 10.1039/b808004f
19. M. Morana, P. Koers, C. Waldauf, M. Koppe, D. Muehlbacher, P. Denk, M. Scharber, D. Waller, and C. Brabec, Adv. Funct. Mater. 1616-301X 17, 3274 (2007). 10.1002/adfm.200700124
20. H. Sirringhaus, P. J. Brown, R. H. Friend, M. M. Nielsen, K. Bechgaard, B. M. W. Langeveld-Voss, A. J. H. Spiering, R. A. J. Janssen, E. W. Meijer, P. Herwig, and D. M. de Leeuw, Nature (London) 0028-0836 401, 685 (1999). 10.1038/44359
21. W. Takashima, T. Murasaki, S. Nagamatsu, T. Morita, and K. Kaneto, Appl. Phys. Lett. 0003-6951 91, 071905 (2007). 10.1063/1.2770963
22. E. J. Meijer, D. M. de Leeuw, S. Setayesh, E. van Veenendaal, B. H. Huisman, P. W. M. Blom, J. C. Hummelen, U. Scherf, J. Kadam, and T. M. Klapwijk, Nature Mater. 1476-1122 2, 678 (2003). 10.1038/nmat978
23. L. L. Chua, J. Zaumseil, J. F. Chang, E. C. W. Ou, P. K. H. Ho, H. Sirringhaus, and R. H. Friend, Nature (London) 0028-0836 434, 194 (2005). 10.1038/nature03376
24. T. D. Anthopoulos, D. M. de Leeuw, E. Cantatore, S. Setayesh, E. J. Meijer, C. Tanase, J. C. Hummelen, and P. W. M. Blom, Appl. Phys. Lett. 0003-6951 85, 4205 (2004). 10.1063/1.1812577