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Applied Physics A: Materials Science and Processing

Volumn 95, Issue 1, 2009, Pages 107-111

Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigation of epitaxial growth of F 16CuPc thin films on graphite

(4) Huang, Yu Li a Chen, Wei a Chen, Shi a Wee, Andrew Thye Shen a

a NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; EPITAXIAL FILMS; EPITAXIAL GROWTH; GRAPHITE; MOLECULAR BEAM EPITAXY; MOLECULAR ORIENTATION; MONOLAYERS; SCANNING; X RAY ABSORPTION;

COPPER-HEXADECAFLUOROPHTHALOCYANINE; HIGHLY ORIENTED PYROLYTIC GRAPHITES; IN-PLANE ORIENTATIONS; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPIES; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURES; ORGANIC THIN FILMS; SECOND LAYERS;

SCANNING TUNNELING MICROSCOPY;

EID: 60749105743 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-008-5000-6 Document Type: Article

Times cited : (25)

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