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Volumn 83, Issue 6, 1998, Pages 3323-3336
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Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000096595
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.367101 Document Type: Article |
Times cited : (1027)
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References (31)
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