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Volumn 83, Issue 6, 1998, Pages 3323-3336

Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000096595     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367101     Document Type: Article
Times cited : (991)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.