Nucleation in organic thin film growth: Perylene on Al 2O 3/Ni 3Al(111)

Journal of Physical Chemistry C

Volumn 113, Issue 25, 2009, Pages 10990-10996

  Casu, M Benedetta ^a,b   Scholl, Achim ^b   Bauchspiess, K Rudolf ^b   Hübner, Dominique ^b   Schmidt, Thomas ^b   Heske, Clemens ^b,c   Umbach, Eberhard ^b,d  

^a UNIVERSITY OF TÜBINGEN   (Germany)

^b UNIVERSITY OF WÜRZBURG   (Germany)

^c UNIVERSITY OF NEVADA   (United States)

^d KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; GROWTH PARAMETERS; MODEL SYSTEM; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ORGANIC FIELD EFFECT TRANSISTORS; ORGANIC LAYERS; ORGANIC THIN FILMS; PERYLENE; SAMPLE PREPARATION;

ABSORPTION SPECTROSCOPY; ALUMINUM; ELECTRON TRANSITIONS; FILM GROWTH; FILM PREPARATION; MOLECULAR ORIENTATION; MONOLAYERS; NUCLEATION; THIN FILMS; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

FIELD EFFECT TRANSISTORS;

EID: 67650725837     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp809497h     Document Type: Article

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