Simulating X-ray diffraction of textured films

Journal of Applied Crystallography

Volumn 41, Issue 2, 2008, Pages 262-271

  Breiby, Dag W ^a   Bunk, Oliver ^b   Andreasen, Jens W ^c   Lemke, Henrik T ^d   Nielsen, Martin M ^c,d  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^d UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

Fibre diffraction; Grazing incidence X ray diffraction (GIXD); Simulations; Thin films; Wide angle X ray scattering (WAXS)

Indexed keywords

EID: 40849130974     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808001064     Document Type: Article

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