Variations in semiconducting polymer microstructure and hole mobility with spin-coating speed

Chemistry of Materials

Volumn 17, Issue 23, 2005, Pages 5610-5612

  DeLongchamp, Dean M ^a   Vogel, Brandon M ^a   Jung, Youngsuk ^a   Gurau, Marc C ^a   Richter, Curt A ^a   Kirillov, Oleg A ^a   Obrzut, Jan ^a   Fischer, Daniel A ^a   Sambasivan, Sharadha ^a   Richter, Lee J ^a   Lin, Eric K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISORDERED MATERIALS; PLANE-ON ORIENTATION; SPIN SPEED;

DRYING; HOLE MOBILITY; MICROSTRUCTURE; SPIN COATING;

SEMICONDUCTING POLYMERS;

EID: 28044469300     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm0513637     Document Type: Article

References (28)

1. Gamota, D. R.; Brazis, P.; Kalyanasundaram, K.; Zhang, J. Printed Organic and Molecular Electronics; Kluwer Academic Publishers: New York, 2004.
2. Sirringhaus, H.; Brown, P. J.; Friend, R. H.; Nielsen, M. M.; Bechgaard, K.; Langeveld-Voss, B. M. W.; Spiering, A. J. H.; Janssen, R. A. J.; Meijer, E. W.; Herwig, P.; de Leeuw, D. M. Nature 1999, 401, 685.
3. Kline, R. J.; McGehee, M. D.; Kadnikova, E. N.; Liu, J. S.; Fréchet, J. M. J. Adv. Mater. 2003, 15, 1519.
4. Zen, A.; Pflaum, J.; Hirschmann, S.; Zhuang, W.; Jaiser, F.; Asawapirom, U.; Rabe, J. P.; Scherf, U.; Neher, D. Adv. Funct. Mater. 2004, 14, 757.
5. Goh, C.; Kline, R. J.; McGehee, M. D.; Kadnikova, E. N.; Frechet, J. M. J. Appl. Phys. Lett. 2005, 86.
6. Kline, R. J.; McGehee, M. D.; Kadnikova, E. N.; Liu, J. S.; Frechet, J. M. J.; Toney, M. F. Macromolecules 2005, 38, 3312.
7. Bao, Z.; Dodabalapur, A.; Lovinger, A. J. Appl. Phys. Lett. 1996, 69, 4108.
8. Chang, J. F.; Sun, B. Q.; Breiby, D. W.; Nielsen, M. M.; Solling, T. I.; Giles, M.; McCulloch, I.; Sirringhaus, H. Chem. Mater. 2004, 16, 4772.
9. Meyerhofer, D. J. Appl. Phys. 1978, 3993.
10. Loewe, R. S.; Khersonsky, S. M.; McCullough, R. D. Adv. Mater. 1999, 11, 250.
11. Stöhr, J. NEXAFS Spectroscopy; Springer-Verlag: Berlin, 1992.
12. Yokoyama, T.; Seki, K.; Morisada, I.; Edamatsu, K.; Ohta, T. Phys. Scr. 1990, 41, 189.
13. Agren, H.; Vahtras, O.; Carravetta, V. Chem. Phys. 1995, 196, 47.
14. Frey, S.; Stadler, V.; Heister, K.; Eck, W.; Zharnikov, M.; Grunze, M.; Zeysing, B.; Terfort, A. Langmuir 2001, 17, 2408.
15. Wu, W. L.; Sambasivan, S.; Wang, C. Y.; Wallace, W. E.; Genzer, J.; Fischer, D. A. Eur. Phys. J. E 2003, 12, 127.
16. Zhokhavets, U.; Gobsch, G.; Hoppe, H.; Sariciftci, N. S. Synth. Met. 2004, 143, 113.
17. Zhokhavets, U.; Gobsch, G.; Hoppe, H.; Sariciftci, N. S. Thin Solid Films 2004, 451-452, 69.
18. Yang, H. C.; Shin, T. J.; Yang, L.; Cho, K.; Ryu, C. Y.; Bao, Z. N. Adv. Funct. Mater. 2005, 15, 671.
19. Gundlach, D. J.; Shur, M. S.; Jackson, T.; Kanicki, J.; Martin, S.; Dodabalapur, A.; Crone, B. Electrical Behavior of Organic Transistors and Circuits. In Printed organic and molecular electronics; Gamota, D., Brazis, P. W., Kalyanasundaram, K., Zhang, J., Eds.; Kluwer Academic Publishers: New York, 2004.
20. Wang, G. M.; Swensen, J.; Moses, D.; Heeger, A. J. J. Appl. Phys. 2003, 93, 6137.
21. Aasmundtveit, K. E.; Samuelsen, E. J.; Guldstein, M.; Steinsland, C.; Flornes, O.; Fagermo, C.; Seeberg, T. M.; Pettersson, L. A. A.; Inganas, O.; Feidenhans'l, R.; Ferrer, S. Macromolecules 2000, 33, 3120.
22. Hugger, S.; Thomann, R.; Heinzel, T.; Thurn-Albrecht, T. Colloid Polym. Sci. 2004, 282, 932.
23. Breiby, D. W.; Samuelsen, E. J. J. Polym. Sci., Part B: Polym. Phys. 2003, 41, 2375.
24. Yue, S.; Berry, G. C.; McCullough, R. D. Macromolecules 1996, 29, 933.
25. Yamamoto, T.; Komarudin, D.; Arai, M.; Lee, B. L.; Suganuma, H.; Asakawa, N.; Inoue, Y.; Kubota, K.; Sasaki, S.; Fukuda, T.; Matsuda, H. J. Am. Chem. Soc. 1998, 120, 2047.
26. Kiriy, N.; Jahne, E.; Adler, H. J.; Schneider, M.; Kiriy, A.; Gorodyska, G.; Minko, S.; Jehnichen, D.; Simon, P.; Fokin, A. A.; Stamm, M. Nano Lett. 2003, 3, 707.
27. Kim, D. H.; Park, Y. D.; Jang, Y.; Kim, S.; Cho, K. Macromol. Rapid Commun. 2005, 26, 834.
28. Certain equipment, instruments, or materials are identified in this paper to adequately specify the experimental details. Such identification does not imply recommendation by the National Institute of Standards and Technology nor does it imply the materials are necessarily the best available for the purpose.