Surface characteristics of polyfluorene films studied by polarization-dependent NEXAFS spectroscopy

Macromolecules

Volumn 38, Issue 3, 2005, Pages 867-872

  Jung, Youngsuk ^a   Cho, Tai Yon ^a   Yoon, Do Y ^a   Frank, Curtis W ^b   Lüning, Jan ^c  

^a Seoul National University   (South Korea)

^b Stanford University   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON YIELD (AEY); CHARGE MOBILITY; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS) SPECTROSCOPY; POLYFLUORENE FILMS;

ABSORPTION; ABSORPTION SPECTROSCOPY; ANNEALING; CHARGE TRANSFER; ELECTRODES; ELECTROLUMINESCENCE; INTERFACES (MATERIALS); MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; PARAMETER ESTIMATION; POLARIZATION; PROBABILITY; SUBSTITUTION REACTIONS; SURFACE CHEMISTRY; THERMOTROPIC LIQUID CRYSTALS; THIN FILMS;

FLUORINE CONTAINING POLYMERS;

EID: 13444250118     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma0483221     Document Type: Article

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