Measuring molecular order in poly(3-alkylthiophene) thin films with polarizing spectroscopies

Langmuir

Volumn 23, Issue 2, 2007, Pages 834-842

  Gurau, Marc C ^a   Delongchamp, Dean M ^b   Vogel, Brandon M ^b   Lin, Eric K ^b   Fischer, Daniel A ^b   Sambasivan, Sharadha ^b   Richter, Lee J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED (IR) ABSORPTION; MOLECULAR ORDER; POLARIZING SPECTROSCOPIES; SPECTROSCOPIC ELLIPSOMETRY (SE);

ABSORPTION; CRYSTALLIZATION; ELLIPSOMETRY; MOLECULAR DYNAMICS; POLARIZATION; SPECTROSCOPIC ANALYSIS;

THIN FILMS;

POLYMER; THIOPHENE DERIVATIVE;

ALGORITHM; ARTICLE; CHEMICAL MODEL; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ENZYME SPECIFICITY; INFRARED SPECTROPHOTOMETRY; INFRARED SPECTROSCOPY; METHODOLOGY; PHOTON; SPECTROPHOTOMETRY; STATISTICAL MODEL; TEMPERATURE; ULTRAVIOLET SPECTROPHOTOMETRY; X RAY;

ALGORITHMS; CRYSTALLIZATION; MODELS, CHEMICAL; MODELS, STATISTICAL; MOLECULAR CONFORMATION; PHOTONS; POLYMERS; SPECTROPHOTOMETRY; SPECTROPHOTOMETRY, INFRARED; SPECTROPHOTOMETRY, ULTRAVIOLET; SPECTROSCOPY, FOURIER TRANSFORM INFRARED; SUBSTRATE SPECIFICITY; TEMPERATURE; THIOPHENES; X-RAYS;

EID: 33846854651     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0618972     Document Type: Article

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