Polarized optical absorption spectroscopy, NEXAFS, and GIXRD measurements of chain alignment in polyfluorene thin films

Macromolecules

Volumn 41, Issue 17, 2008, Pages 6463-6472

  Cheun, H ^a   Liu, X ^a   Himpsel, F J ^a   Knaapila, M ^b   Scherf, U ^c   Torkkeli, M ^d   Winokur, M J ^a  

^a University of Wisconsin Madison   (United States)

^b LUND UNIVERSITY   (Sweden)

^c UNIVERSITY OF WUPPERTAL   (Germany)

^d UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

BOTTOM SURFACES; CRYSTAL STATES; DATA SUPPORT; DICHROIC RATIOS; FILM-THICKNESS; FLUORENE; GRAZING INCIDENCE X-RAY DIFFRACTION; INHOMOGENEITIES; LOW-MOLECULAR WEIGHT; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; OPTICAL-; POLARIZED OPTICAL ABSORPTION; POLYFLUORENE; RUBBED POLYIMIDE; STRUCTURAL MODEL; TOP SURFACE; UNIAXIAL ALIGNMENT;

ABSORPTION; ALIGNMENT; ANNEALING; CARBON FILMS; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY ABSORPTION; LIGHT ABSORPTION; LIGHT SOURCES; LIQUID CRYSTALS; MAGNETIC FILMS; MODEL STRUCTURES; MOLECULAR BEAM EPITAXY; MONOLAYERS; NEMATIC LIQUID CRYSTALS; POLYMERS; THICK FILMS; THIN FILMS; TRANSPORT PROPERTIES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 52449104616     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma702579r     Document Type: Article

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