Correlating the microstructure of thin films of poly[5,5-bis(3-dodecyl-2- thienyl)-2,2-bithiophene] with charge transport: Effect of dielectric surface energy and thermal annealing

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 12, 2008, Pages

  Jimison, Leslie H ^a   Salleo, Alberto ^a   Chabinyc, Michael L ^c   Bernstein, David P ^b,d   Toney, Michael F ^d  

^a Stanford University   (United States)

^b STANFORD UNIVERSITY   (United States)

^c PALO ALTO RESEARCH CENTER   (United States)

^d SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 52949106876     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.125319     Document Type: Article

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