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Volumn 38, Issue 23, 2005, Pages 9617-9624

Highly oriented growth of p-sexiphenyl molecular nanocrystals on rubbed polymethylene surface

Author keywords

[No Author keywords available]

Indexed keywords

CATALYSIS; CRYSTAL GROWTH; DECOMPOSITION; INFRARED SPECTROSCOPY; MOLECULAR DYNAMICS; SURFACE PHENOMENA; X RAY DIFFRACTION;

EID: 28144439226     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma051298m     Document Type: Article
Times cited : (23)

References (40)
  • 33
    • 0342666234 scopus 로고    scopus 로고
    • The reflection IR probes the whole thickness of the film, yet the NEXAFS is known to probe only the top tens of nanometers. Stöhr, J.; Anders S. IBM J. Res. Dev. 2000, 44, 535.
    • (2000) IBM J. Res. Dev. , vol.44 , pp. 535
    • Stöhr, J.1    Anders, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.