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Volumn 17, Issue 11, 2010, Pages

Comparison of electrostatic and electromagnetic simulations for very high frequency plasmas

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVELY COUPLED PLASMAS; CONSTANT FREQUENCY; DENSITY PROFILE; DIFFERENT DISTRIBUTIONS; DISCHARGE CHARACTERISTICS; DISCHARGE CONDITIONS; EDGE EFFECT; ELECTROMAGNETIC EFFECTS; ELECTROMAGNETIC MODELS; ELECTROMAGNETIC SIMULATION; ELECTROSTATIC MODELS; EXCITATION SOURCES; FLUID MODELS; HIGH FREQUENCY; IONIZATION RATES; PLASMA CHARACTERISTICS; PRESSURE INCREASE; STANDING WAVE EFFECTS; VERY HIGH FREQUENCY; VERY HIGH FREQUENCY PLASMA;

EID: 78650261577     PISSN: 1070664X     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3519515     Document Type: Article
Times cited : (41)

References (33)
  • 1
    • 0026370910 scopus 로고
    • ITPSBD 0093-3813,. 10.1109/27.125030
    • J. W. Coburn, IEEE Trans. Plasma Sci. ITPSBD 0093-3813 19, 1048 (1991). 10.1109/27.125030
    • (1991) IEEE Trans. Plasma Sci. , vol.19 , pp. 1048
    • Coburn, J.W.1
  • 7
    • 0037434207 scopus 로고    scopus 로고
    • APPLAB 0003-6951,. 10.1063/1.1534918
    • L. Sansonnens and J. Schmitt, Appl. Phys. Lett. APPLAB 0003-6951 82, 182 (2003). 10.1063/1.1534918
    • (2003) Appl. Phys. Lett. , vol.82 , pp. 182
    • Sansonnens, L.1    Schmitt, J.2
  • 8
    • 20444485323 scopus 로고    scopus 로고
    • Calculation of the electrode shape for suppression of the standing wave effect in large area rectangular capacitively coupled reactors
    • DOI 10.1063/1.1862770, 063304
    • L. Sansonnens, J. Appl. Phys. JAPIAU 0021-8979 97, 063304 (2005). 10.1063/1.1862770 (Pubitemid 40818127)
    • (2005) Journal of Applied Physics , vol.97 , Issue.6 , pp. 1-6
    • Sansonnens, L.1
  • 9
    • 28844453207 scopus 로고    scopus 로고
    • Inductive heating and e to H transitions in capacitive discharges
    • DOI 10.1103/PhysRevLett.95.205001, 205001
    • P. Chabert, J. -L. Raimbault, P. Levif, J. -M. Rax, and M. A. Lieberman, Phys. Rev. Lett. PRLTAO 0031-9007 95, 205001 (2005). 10.1103/PhysRevLett.95. 205001 (Pubitemid 41777127)
    • (2005) Physical Review Letters , vol.95 , Issue.20 , pp. 1-4
    • Chabert, P.1    Raimbault, J.-L.2    Levif, P.3    Rax, J.-M.4    Lieberman, M.A.5
  • 11
    • 43249115427 scopus 로고    scopus 로고
    • Modeling electromagnetic effects in capacitive discharges
    • DOI 10.1088/0963-0252/17/1/015018, PII S0963025208568460
    • I. Lee, D. B. Graves, and M. A. Lieberman, Plasma Sources Sci. Technol. PSTEEU 0963-0252 17, 015018 (2008). 10.1088/0963-0252/17/1/015018 (Pubitemid 351653487)
    • (2008) Plasma Sources Science and Technology , vol.17 , Issue.1 , pp. 015018
    • Lee, I.1    Graves, D.B.2    Lieberman, M.A.3
  • 12
  • 14
    • 77958157526 scopus 로고    scopus 로고
    • JAPIAU 0021-8979,. 10.1063/1.3489950
    • Z. Chen, S. Rauf, and K. Collins, J. Appl. Phys. JAPIAU 0021-8979 108, 073301 (2010). 10.1063/1.3489950
    • (2010) J. Appl. Phys. , vol.108 , pp. 073301
    • Chen, Z.1    Rauf, S.2    Collins, K.3
  • 15
    • 23844533315 scopus 로고    scopus 로고
    • Numerical simulation of dual frequency etching reactors: Influence of the external process parameters on the plasma characteristics
    • DOI 10.1063/1.1989439, 023308
    • V. Georgieva and A. Bogaerts, J. Appl. Phys. JAPIAU 0021-8979 98, 023308 (2005). 10.1063/1.1989439 (Pubitemid 41144509)
    • (2005) Journal of Applied Physics , vol.98 , Issue.2 , pp. 1-13
    • Georgieva, V.1    Bogaerts, A.2
  • 16
    • 33745586628 scopus 로고    scopus 로고
    • 2 discharge in an asymmetric dual frequency reactor: Numerical investigation by a PIC/MC model
    • DOI 10.1088/0963-0252/15/3/010, PII S0963025206039053, 010
    • V. Georgieva and A. Bogaerts, Plasma Sources Sci. Technol. PSTEEU 0963-0252 15, 368 (2006). 10.1088/0963-0252/15/3/010 (Pubitemid 43982986)
    • (2006) Plasma Sources Science and Technology , vol.15 , Issue.3 , pp. 368-377
    • Georgieva, V.1    Bogaerts, A.2
  • 19
    • 77950570034 scopus 로고    scopus 로고
    • JPAPBE 0022-3727,. 10.1088/0022-3727/43/15/152001
    • Y. Yang and M. J. Kushner, J. Phys. D: Appl. Phys. JPAPBE 0022-3727 43, 152001 (2010). 10.1088/0022-3727/43/15/152001
    • (2010) J. Phys. D: Appl. Phys. , vol.43 , pp. 152001
    • Yang, Y.1    Kushner, M.J.2
  • 20
    • 78149306024 scopus 로고    scopus 로고
    • PSTEEU 0963-0252,. 10.1088/0963-0252/19/5/055011
    • Y. Yang and M. J. Kushner, Plasma Sources Sci. Technol. PSTEEU 0963-0252 19, 055011 (2010). 10.1088/0963-0252/19/5/055011
    • (2010) Plasma Sources Sci. Technol. , vol.19 , pp. 055011
    • Yang, Y.1    Kushner, M.J.2
  • 21
    • 78149306024 scopus 로고    scopus 로고
    • PSTEEU 0963-0252,. 10.1088/0963-0252/19/5/055012
    • Y. Yang and M. J. Kushner, Plasma Sources Sci. Technol. PSTEEU 0963-0252 19, 055012 (2010). 10.1088/0963-0252/19/5/055012
    • (2010) Plasma Sources Sci. Technol. , vol.19 , pp. 055012
    • Yang, Y.1    Kushner, M.J.2
  • 25
    • 33750599441 scopus 로고    scopus 로고
    • Spatial and frequency dependence of plasma currents in a 300 mm capacitively coupled plasma reactor
    • DOI 10.1088/0963-0252/15/4/036, PII S0963025206232924, 036
    • P. A. Miller, E. V. Barnat, G. A. Hebner, A. M. Paterson, and J. P. Holland, Plasma Sources Sci. Technol. PSTEEU 0963-0252 15, 889 (2006). 10.1088/0963-0252/15/4/036 (Pubitemid 44679437)
    • (2006) Plasma Sources Science and Technology , vol.15 , Issue.4 , pp. 889-899
    • Miller, P.A.1    Barnat, E.V.2    Hebner, G.A.3    Paterson, A.M.4    Holland, J.P.5
  • 26
    • 33750586214 scopus 로고    scopus 로고
    • Frequency dependent plasma characteristics in a capacitively coupled 300 mm wafer plasma processing chamber
    • DOI 10.1088/0963-0252/15/4/035, PII S0963025206232900, 035
    • G. A. Hebner, E. V. Barnat, P. A. Miller, A. M. Paterson, and J. P. Holland, Plasma Sources Sci. Technol. PSTEEU 0963-0252 15, 879 (2006). 10.1088/0963-0252/15/4/035 (Pubitemid 44679436)
    • (2006) Plasma Sources Science and Technology , vol.15 , Issue.4 , pp. 879-888
    • Hebner, G.A.1    Barnat, E.V.2    Miller, P.A.3    Paterson, A.M.4    Holland, J.P.5
  • 27
    • 48249136232 scopus 로고    scopus 로고
    • APPLAB 0003-6951,. 10.1063/1.2965118
    • S. K. Ahn and H. Y. Chang, Appl. Phys. Lett. APPLAB 0003-6951 93, 031506 (2008). 10.1063/1.2965118
    • (2008) Appl. Phys. Lett. , vol.93 , pp. 031506
    • Ahn, S.K.1    Chang, H.Y.2
  • 31
    • 36449001192 scopus 로고
    • JAPIAU 0021-8979,. 10.1063/1.352250
    • E. Gogolides and H. H. Sawin, J. Appl. Phys. JAPIAU 0021-8979 72, 3971 (1992). 10.1063/1.352250
    • (1992) J. Appl. Phys. , vol.72 , pp. 3971
    • Gogolides, E.1    Sawin, H.H.2
  • 33
    • 33745603794 scopus 로고    scopus 로고
    • Electromagnetic field nonuniformities in large area, high-frequency capacitive plasma reactors, including electrode asymmetry effects
    • DOI 10.1088/0963-0252/15/3/002, PII S0963025206087317, 002
    • L. Sansonnens, A. A. Howling, and Ch. Hollenstein, Plasma Sources Sci. Technol. PSTEEU 0963-0252 15, 302 (2006). 10.1088/0963-0252/15/3/002 (Pubitemid 43982978)
    • (2006) Plasma Sources Science and Technology , vol.15 , Issue.3 , pp. 302-313
    • Sansonnens, L.1    Howling, A.A.2    Hollenstein, Ch.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.