메뉴 건너뛰기




Volumn 57, Issue 12, 2010, Pages 3222-3230

On the possibility of obtaining MOSFET-like performance and Sub-60-mV/dec swing in 1-D broken-gap tunnel transistors

Author keywords

Band to band tunneling; broken gap; heterojunction; phonon scattering; subthreshold swing; tunneling field effect transistor (TFET)

Indexed keywords

BAND TO BAND TUNNELING; BROKEN GAP; ELECTRON PHONON SCATTERING; ELECTROSTATIC CONTROL; HIGH DRIVE CURRENT; HIGH-PERFORMANCE OPERATION; HOMOJUNCTION; MATERIAL SYSTEMS; MOS-FET; MOSFET PERFORMANCE; NON-EQUILIBRIUM GREEN'S FUNCTION FORMALISM; OFF-STATE LEAKAGE; PERFORMANCE POTENTIALS; POWER DISSIPATION; QUANTUM CONFINEMENT EFFECTS; QUANTUM TRANSPORT SIMULATIONS; ROOM TEMPERATURE; SUBTHRESHOLD SWING; SUPPLY VOLTAGES; THERMALIZATION; TUNNEL TRANSISTORS; TUNNELING FIELD-EFFECT TRANSISTORS;

EID: 78649988576     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2010.2079250     Document Type: Article
Times cited : (171)

References (40)
  • 2
    • 0026854214 scopus 로고
    • Proposal for surface tunnel transistors
    • Apr.
    • T. Baba, "Proposal for surface tunnel transistors," Jpn. J. Appl. Phys. 2, Lett., vol. 31, no. 4B, pp. L455-L457, Apr. 1992.
    • (1992) Jpn. J. Appl. Phys. 2, Lett. , vol.31 B , Issue.4
    • Baba, T.1
  • 3
    • 0034225075 scopus 로고    scopus 로고
    • Vertical MOS-gated Esaki tunneling transistor in silicon
    • Jul.
    • W. Hansch, C. Fink, J. Schulze, and I. Eisele, "Vertical MOS-gated Esaki tunneling transistor in silicon," Thin Solid Films, vol. 369, no. 1/2, pp. 387-389, Jul. 2000.
    • (2000) Thin Solid Films , vol.369 , Issue.1-2 , pp. 387-389
    • Hansch, W.1    Fink, C.2    Schulze, J.3    Eisele, I.4
  • 5
    • 18844389545 scopus 로고    scopus 로고
    • Scaling the vertical tunnel FET with tunnel bandgap modulation and gate workfunction engineering
    • May
    • K. K. Bhuwalka, J. Schulze, and I. Eisele, "Scaling the vertical tunnel FET with tunnel bandgap modulation and gate workfunction engineering," IEEE Trans. Electron Devices, vol. 52, no. 5, pp. 909-917, May 2005.
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.5 , pp. 909-917
    • Bhuwalka, K.K.1    Schulze, J.2    Eisele, I.3
  • 6
    • 29244461475 scopus 로고    scopus 로고
    • Comparing carbon nanotube transistors\The ideal choice: A novel tunneling device design
    • Dec.
    • J. Appenzeller, Y. M. Lin, J. Knoch, Z. H. Chen, and P. Avouris, "Comparing carbon nanotube transistors\The ideal choice: A novel tunneling device design," IEEE Trans. Electron Devices, vol. 52, no. 12, pp. 2568-2576, Dec. 2005.
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.12 , pp. 2568-2576
    • Appenzeller, J.1    Lin, Y.M.2    Knoch, J.3    Chen, Z.H.4    Avouris, P.5
  • 7
    • 33847748968 scopus 로고    scopus 로고
    • Computational study of carbon nanotube p-i-n tunnel FETs
    • S. O. Koswatta, D. E. Nikonov, and M. S. Lundstrom, "Computational study of carbon nanotube p-i-n tunnel FETs," in IEDM Tech. Dig., 2005, pp. 518-521.
    • (2005) IEDM Tech. Dig. , pp. 518-521
    • Koswatta, S.O.1    Nikonov, D.E.2    Lundstrom, M.S.3
  • 8
    • 33645650318 scopus 로고    scopus 로고
    • Low-subthreshold-swing tunnel transistors
    • Apr.
    • Q. Zhang, W. Zhao, and A. Seabaugh, "Low-subthreshold-swing tunnel transistors," IEEE Electron Device Lett., vol. 27, no. 4, pp. 297-300, Apr. 2006.
    • (2006) IEEE Electron Device Lett. , vol.27 , Issue.4 , pp. 297-300
    • Zhang, Q.1    Zhao, W.2    Seabaugh, A.3
  • 9
    • 36249031568 scopus 로고    scopus 로고
    • Length scaling of the double gate tunnel FET with a high-K gate dielectric
    • Nov./Dec.
    • K. Boucart and A. M. Ionescu, "Length scaling of the double gate tunnel FET with a high-K gate dielectric," Solid State Electron., vol. 51, no. 11/12, pp. 1500-1507, Nov./Dec. 2007.
    • (2007) Solid State Electron. , vol.51 , Issue.11-12 , pp. 1500-1507
    • Boucart, K.1    Ionescu, A.M.2
  • 10
    • 54249110984 scopus 로고    scopus 로고
    • Device design and scalability of a double-gate tunneling field-effect transistor with silicon-germanium source
    • Apr.
    • E. H. Toh, G. H. Wang, L. Chan, D. Sylvester, C. H. Heng, G. S. Samudra, and Y. C. Yeo, "Device design and scalability of a double-gate tunneling field-effect transistor with silicon-germanium source," Jpn. J. Appl. Phys., vol. 47, no. 4, pp. 2593-2597, Apr. 2008.
    • (2008) Jpn. J. Appl. Phys. , vol.47 , Issue.4 , pp. 2593-2597
    • Toh, E.H.1    Wang, G.H.2    Chan, L.3    Sylvester, D.4    Heng, C.H.5    Samudra, G.S.6    Yeo, Y.C.7
  • 11
    • 50649109864 scopus 로고    scopus 로고
    • Design of tunneling field-effect transistors using strained-silicon/ strained-germanium type-II staggered heterojunctions
    • Sep.
    • O. M. Nayfeh, C. N. Chleirigh, J. Hennessy, L. Gomez, J. L. Hoyt, and D. A. Antoniadis, "Design of tunneling field-effect transistors using strained-silicon/strained-germanium type-II staggered heterojunctions," IEEE Electron Device Lett., vol. 29, no. 9, pp. 1074-1077, Sep. 2008.
    • (2008) IEEE Electron Device Lett. , vol.29 , Issue.9 , pp. 1074-1077
    • Nayfeh, O.M.1    Chleirigh, C.N.2    Hennessy, J.3    Gomez, L.4    Hoyt, J.L.5    Antoniadis, D.A.6
  • 13
    • 64549108830 scopus 로고    scopus 로고
    • Double-gate strained-Ge heterostructure tunneling FET (TFET) with record high drive currents and < 60 mV/dec subthreshold slope
    • T. Krishnamohan, K. Donghyun, S. Raghunathan, and K. Saraswat, "Double-gate strained-Ge heterostructure tunneling FET (TFET) with record high drive currents and < 60 mV/dec subthreshold slope. IEDM Tech. Dig. 2008, 947-949.
    • (2008) IEDM Tech. Dig. , pp. 947-949
    • Krishnamohan, T.1    Donghyun, K.2    Raghunathan, S.3    Saraswat, K.4
  • 16
    • 54849404161 scopus 로고    scopus 로고
    • Tunneling phenomena in carbon nanotube field-effect transistors
    • J. Knoch and J. Appenzeller, "Tunneling phenomena in carbon nanotube field-effect transistors," Phys. Stat. Sol. (A), vol. 205, no. 4, pp. 679-694, 2008.
    • (2008) Phys. Stat. Sol. (A) , vol.205 , Issue.4 , pp. 679-694
    • Knoch, J.1    Appenzeller, J.2
  • 18
    • 72049108660 scopus 로고    scopus 로고
    • On enhanced miller capacitance effect in interband tunnel transistors
    • Oct.
    • S. Mookerjea, R. Krishnan, S. Datta, and V. Narayanan, "On enhanced miller capacitance effect in interband tunnel transistors," IEEE Electron Device Lett., vol. 30, no. 10, pp. 1102-1104, Oct. 2009.
    • (2009) IEEE Electron Device Lett. , vol.30 , Issue.10 , pp. 1102-1104
    • Mookerjea, S.1    Krishnan, R.2    Datta, S.3    Narayanan, V.4
  • 19
    • 77952366678 scopus 로고    scopus 로고
    • 1D broken-gap tunnel transistor with MOSFET-like on-currents and sub-60 mV/dec subthresh-old swing
    • S. O. Koswatta, S. J. Koester, and W. Haensch, "1D broken-gap tunnel transistor with MOSFET-like on-currents and sub-60 mV/dec subthresh-old swing," in IEDM Tech. Dig., 2009, pp. 909-912.
    • (2009) IEDM Tech. Dig. , pp. 909-912
    • Koswatta, S.O.1    Koester, S.J.2    Haensch, W.3
  • 20
    • 77953027774 scopus 로고    scopus 로고
    • Performance comparisons of tunneling field-effect transistors made of InSb, carbon, and GaSb-InAs broken gap heterostructures
    • M. Luisier and G. Klimeck, "Performance comparisons of tunneling field-effect transistors made of InSb, carbon, and GaSb-InAs broken gap heterostructures," in IEDM Tech. Dig., 2009, pp. 913-916.
    • (2009) IEDM Tech. Dig. , pp. 913-916
    • Luisier, M.1    Klimeck, G.2
  • 21
    • 77950076092 scopus 로고    scopus 로고
    • Optimizing tunnel FET performance\Impact of device structure, transistor dimensions and choice of material
    • J. Knoch, "Optimizing tunnel FET performance\Impact of device structure, transistor dimensions and choice of material," in Proc. Int. Symp. VLSI-TSA, 2009, pp. 45-46.
    • (2009) Proc. Int. Symp. VLSI-TSA , pp. 45-46
    • Knoch, J.1
  • 22
    • 77950089187 scopus 로고    scopus 로고
    • Modeling of high-performance p-type III-V heterojunction tunnel FETs
    • Apr
    • J. Knoch and J. Appenzeller, "Modeling of high-performance p-type III-V heterojunction tunnel FETs," IEEE Electron Device Lett., vol. 31, no. 4, pp. 305-307, Apr. 2010.
    • (2010) IEEE Electron Device Lett. , vol.31 , Issue.4 , pp. 305-307
    • Knoch, J.1    Appenzeller, J.2
  • 25
    • 70549111129 scopus 로고    scopus 로고
    • Drive currents and leakage currents in InSb and InAs nanowire and carbon nanotube band-to-band tunneling FETs
    • Dec.
    • M. A. Khayer and R. K. Lake, "Drive currents and leakage currents in InSb and InAs nanowire and carbon nanotube band-to-band tunneling FETs," IEEE Electron Device Lett., vol. 30, no. 12, pp. 1257-1259, Dec. 2009.
    • (2009) IEEE Electron Device Lett. , vol.30 , Issue.12 , pp. 1257-1259
    • Khayer, M.A.1    Lake, R.K.2
  • 26
    • 26244456096 scopus 로고    scopus 로고
    • A quantum-mechanical treatment of phonon scattering in carbon nanotube transistors
    • Sep.
    • J. Guo, "A quantum-mechanical treatment of phonon scattering in carbon nanotube transistors," J. Appl. Phys., vol. 98, no. 6, p. 063 519, Sep. 2005.
    • (2005) J. Appl. Phys. , vol.98 , Issue.6 , pp. 063519
    • Guo, J.1
  • 27
    • 38849085377 scopus 로고    scopus 로고
    • Non-equilibrium Green's function treatment of phonon scattering in carbon nanotube transistors
    • Sep.
    • S. O. Koswatta, S. Hasan, M. S. Lundstrom, M. P. Anantram, and D. E. Nikonov, "Non-equilibrium Green's function treatment of phonon scattering in carbon nanotube transistors," IEEE Trans. Electron Devices, vol. 54, no. 9, pp. 2339-2351, Sep. 2007.
    • (2007) IEEE Trans. Electron Devices , vol.54 , Issue.9 , pp. 2339-2351
    • Koswatta, S.O.1    Hasan, S.2    Lundstrom, M.S.3    Anantram, M.P.4    Nikonov, D.E.5
  • 28
    • 37749030898 scopus 로고    scopus 로고
    • Computational study of the ultimate scaling limits of CNT tunneling devices
    • Jan.
    • S. Poli, S. Reggiani, A. Gnudi, E. Gnani, and G. Baccarani, "Computational study of the ultimate scaling limits of CNT tunneling devices," IEEE Trans. Electron Devices, vol. 55, no. 1, pp. 313-321, Jan. 2008.
    • (2008) IEEE Trans. Electron Devices , vol.55 , Issue.1 , pp. 313-321
    • Poli, S.1    Reggiani, S.2    Gnudi, A.3    Gnani, E.4    Baccarani, G.5
  • 29
    • 38849108905 scopus 로고    scopus 로고
    • Simulation of carbon nan-otube FETs including hot-phonon and self-heating effects
    • Sep.
    • S. Hasan, M. A. Alam, and M. S. Lundstrom, "Simulation of carbon nan-otube FETs including hot-phonon and self-heating effects," IEEE Trans. Electron Devices, vol. 54, no. 9, pp. 2352-2361, Sep. 2007.
    • (2007) IEEE Trans. Electron Devices , vol.54 , Issue.9 , pp. 2352-2361
    • Hasan, S.1    Alam, M.A.2    Lundstrom, M.S.3
  • 31
    • 38849117239 scopus 로고    scopus 로고
    • Influence of phonon scattering on the performance of p-i-n band-to-band tunneling transistors
    • Jan.
    • S. O. Koswatta, M. S. Lundstrom, and D. E. Nikonov, "Influence of phonon scattering on the performance of p-i-n band-to-band tunneling transistors," Appl. Phys. Lett., vol. 92, no. 4, p. 043 125, Jan. 2008.
    • (2008) Appl. Phys. Lett. , vol.92 , Issue.4 , pp. 043125
    • Koswatta, S.O.1    Lundstrom, M.S.2    Nikonov, D.E.3
  • 33
    • 50249185663 scopus 로고    scopus 로고
    • Simulation of electron transport in high-mobility MOSFETs: Density of states bottleneck and source starvation
    • M. V. Fischetti, L. Wang, B. Yu, C. Sachs, P. M. Asbeck, Y. Taur, and M. Rodwell, "Simulation of electron transport in high-mobility MOSFETs: Density of states bottleneck and source starvation," in IEDM Te c h. D i g., 2007, pp. 109-112.
    • (2007) IEDM Tech. Dig. , pp. 109-112
    • Fischetti, M.V.1    Wang, L.2    Yu, B.3    Sachs, C.4    Asbeck, P.M.5    Taur, Y.6    Rodwell, M.7
  • 34
    • 0005810593 scopus 로고
    • Electron-electron scattering in quantum wires and its possible suppression due to spin effects
    • Jun.
    • G. Fasol and H. Sakaki, "Electron-electron scattering in quantum wires and its possible suppression due to spin effects," Phys. Rev. Lett., vol. 70, no. 23, pp. 3643-3646, Jun. 1993.
    • (1993) Phys. Rev. Lett. , vol.70 , Issue.23 , pp. 3643-3646
    • Fasol, G.1    Sakaki, H.2
  • 35
    • 69749099372 scopus 로고    scopus 로고
    • Effective capacitance and drive current for tunnel FET (TFET) CV/I estimation
    • Sep.
    • S. Mookerjea, R. Krishnan, S. Datta, and V. Narayanan, "Effective capacitance and drive current for tunnel FET (TFET) CV/I estimation," IEEE Trans. Electron Devices, vol. 56, no. 9, pp. 2092-2098, Sep. 2009.
    • (2009) IEEE Trans. Electron Devices , vol.56 , Issue.9 , pp. 2092-2098
    • Mookerjea, S.1    Krishnan, R.2    Datta, S.3    Narayanan, V.4
  • 36
    • 62749117201 scopus 로고    scopus 로고
    • Performance comparison between p-i-n tunneling transistors and conventional MOSFETs
    • Mar.
    • S. O. Koswatta, M. S. Lundstrom, and D. E. Nikonov, "Performance comparison between p-i-n tunneling transistors and conventional MOSFETs," IEEE Trans. Electron Devices, vol. 56, no. 3, pp. 456-465, Mar. 2009.
    • (2009) IEEE Trans. Electron Devices , vol.56 , Issue.3 , pp. 456-465
    • Koswatta, S.O.1    Lundstrom, M.S.2    Nikonov, D.E.3
  • 40
    • 0005676388 scopus 로고
    • Resonant interband coupling in single-barrier heterostructures of InAs/GaSb/InAs and GaSb/InAs/GaSb
    • Sep.
    • L. F. Luo, R. Beresford, K. F. Longenbach, and W. I. Wang, "Resonant interband coupling in single-barrier heterostructures of InAs/GaSb/InAs and GaSb/InAs/GaSb," J. Appl. Phys., vol. 68, no. 6, pp. 2854-2857, Sep. 1990
    • (1990) J. Appl. Phys. , vol.68 , Issue.6 , pp. 2854-2857
    • Luo, L.F.1    Beresford, R.2    Longenbach, K.F.3    Wang, W.I.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.