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Volumn 47, Issue 4 PART 2, 2008, Pages 2593-2597

Device design and scalability of a double-gate tunneling field-effect transistor with silicon - germanium source

Author keywords

Double gate; Silicon germanium; Subthreshold swing; TFET; Tunneling

Indexed keywords

BICMOS TECHNOLOGY; FIELD EFFECT TRANSISTORS; GERMANIUM; LEAKAGE CURRENTS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON ALLOYS; TRANSISTORS; TUNNELING (EXCAVATION);

EID: 54249110984     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.2593     Document Type: Article
Times cited : (94)

References (13)
  • 2
    • 54249156406 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors (2006) [http://www.itrs.net/].
    • (2006)
  • 11
    • 54249158303 scopus 로고    scopus 로고
    • Medici Version Y-2006.06, June 2006.
    • Medici Version Y-2006.06, June 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.