-
3
-
-
0039437923
-
-
edited by S. M. Sze (Wiley-Interscience, New York
-
See, for example, S. Luryi and A. Zaslavsky, in Modern Semiconductor Device Physics, edited by S. M. Sze (Wiley-Interscience, New York, 1998), pp. 253-341.
-
(1998)
Modern Semiconductor Device Physics
, pp. 253-341
-
-
Luryi, S.1
Zaslavsky, A.2
-
4
-
-
0042561169
-
-
edited by S. Luryi, J. M. Xu, and A. Zaslavsky Wiley-Interscience, New York
-
P. M. Solomon, in Future Trends in Microelectronics: The Nano Millennium, edited by S. Luryi, J. M. Xu, and A. Zaslavsky (Wiley-Interscience, New York, 2002), pp. 28-42.
-
(2002)
Future Trends in Microelectronics: The Nano Millennium
, pp. 28-42
-
-
Solomon, P.M.1
-
9
-
-
0026854214
-
-
T. Baba, Jpn. J. Appl. Phys., Part 2 31, L455 (1992); T. Uemura and T. Baba, ibid. 31, L1727 (1992); 33, L207 (1994); Y. J. Chun, T. Uemura, and T. Baba, ibid. 39, L1273 (2000).
-
(1992)
Jpn. J. Appl. Phys., Part 2
, vol.31
-
-
Baba, T.1
-
10
-
-
0026971058
-
-
T. Baba, Jpn. J. Appl. Phys., Part 2 31, L455 (1992); T. Uemura and T. Baba, ibid. 31, L1727 (1992); 33, L207 (1994); Y. J. Chun, T. Uemura, and T. Baba, ibid. 39, L1273 (2000).
-
(1992)
Jpn. J. Appl. Phys., Part 2
, vol.31
-
-
Uemura, T.1
Baba, T.2
-
11
-
-
1842516472
-
-
T. Baba, Jpn. J. Appl. Phys., Part 2 31, L455 (1992); T. Uemura and T. Baba, ibid. 31, L1727 (1992); 33, L207 (1994); Y. J. Chun, T. Uemura, and T. Baba, ibid. 39, L1273 (2000).
-
(1994)
Jpn. J. Appl. Phys., Part 2
, vol.33
-
-
-
12
-
-
0034474214
-
-
T. Baba, Jpn. J. Appl. Phys., Part 2 31, L455 (1992); T. Uemura and T. Baba, ibid. 31, L1727 (1992); 33, L207 (1994); Y. J. Chun, T. Uemura, and T. Baba, ibid. 39, L1273 (2000).
-
(2000)
Jpn. J. Appl. Phys., Part 2
, vol.39
-
-
Chun, Y.J.1
Uemura, T.2
Baba, T.3
-
13
-
-
0007981204
-
-
J. Koga and A. Toriumi, Appl. Phys. Lett. 69, 1435 (1996); 70, 2138 (1997); IEEE Electron Device Lett. 20, 529 (1999).
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 1435
-
-
Koga, J.1
Toriumi, A.2
-
14
-
-
1842464239
-
-
J. Koga and A. Toriumi, Appl. Phys. Lett. 69, 1435 (1996); 70, 2138 (1997); IEEE Electron Device Lett. 20, 529 (1999).
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2138
-
-
-
15
-
-
0033341645
-
-
J. Koga and A. Toriumi, Appl. Phys. Lett. 69, 1435 (1996); 70, 2138 (1997); IEEE Electron Device Lett. 20, 529 (1999).
-
(1999)
IEEE Electron Device Lett.
, vol.20
, pp. 529
-
-
-
16
-
-
0034225075
-
-
W. Hansch, C. Fink, J. Schulze, and I. Eisele, Thin Solid Films 369, 387 (2000); W. Hansch, P. Borthen, J. Schulze, C. Fink, T. Sulima, and I. Eisele, Jpn. J. Appl. Phys., Part 1 40, 3131 (2001).
-
(2000)
Thin Solid Films
, vol.369
, pp. 387
-
-
Hansch, W.1
Fink, C.2
Schulze, J.3
Eisele, I.4
-
17
-
-
0035328742
-
-
W. Hansch, C. Fink, J. Schulze, and I. Eisele, Thin Solid Films 369, 387 (2000); W. Hansch, P. Borthen, J. Schulze, C. Fink, T. Sulima, and I. Eisele, Jpn. J. Appl. Phys., Part 1 40, 3131 (2001).
-
(2001)
Jpn. J. Appl. Phys., Part 1
, vol.40
, pp. 3131
-
-
Hansch, W.1
Borthen, P.2
Schulze, J.3
Fink, C.4
Sulima, T.5
Eisele, I.6
-
18
-
-
1442331089
-
-
edited by H. R. Huff, L. Fabry, and S. Kishino Electrochemical Society, Pennington, NJ
-
A. Zaslavsky, D. Mariolle, S. Deleonibus, D. Fraboulet, S. Luryi, J. Liu, C. Aydin, M. Mastrapasqua, C. A. King, and R. Johnson, in Semiconductor Silicon 2002, edited by H. R. Huff, L. Fabry, and S. Kishino (Electrochemical Society, Pennington, NJ, 2002), Vol. 2, pp. 956-967.
-
(2002)
Semiconductor Silicon 2002
, vol.2
, pp. 956-967
-
-
Zaslavsky, A.1
Mariolle, D.2
Deleonibus, S.3
Fraboulet, D.4
Luryi, S.5
Liu, J.6
Aydin, C.7
Mastrapasqua, M.8
King, C.A.9
Johnson, R.10
-
19
-
-
0036923554
-
-
B. Doris, M. Ieong, T. Kanarsky, Y. Zhang, R. A. Roy, O. Dokumaci, Z. Ren, F.-F. Jamin, L. Shi, W. Natzle, H.-J. Huang, J. Mezzapelle, A. Mocuta, S. Womack, M. Gribelyuk, E. C. Jones, R. J. Miller, H.-S. P. Wong, and W. Haensch, Tech. Dig.-Int. Electron Devices Meet. 2002, 267 (2002).
-
(2002)
Tech. Dig.-int. Electron Devices Meet.
, vol.2002
, pp. 267
-
-
Doris, B.1
Ieong, M.2
Kanarsky, T.3
Zhang, Y.4
Roy, R.A.5
Dokumaci, O.6
Ren, Z.7
Jamin, F.-F.8
Shi, L.9
Natzle, W.10
Huang, H.-J.11
Mezzapelle, J.12
Mocuta, A.13
Womack, S.14
Gribelyuk, M.15
Jones, E.C.16
Miller, R.J.17
Wong, H.-S.P.18
Haensch, W.19
-
20
-
-
85039527963
-
-
Our simulations were done using Silvaco's process simulation ATHENA and device simulation ATLAS software packages (Version 5.2.0.R, SILVACO, 1999)
-
Our simulations were done using Silvaco's process simulation ATHENA and device simulation ATLAS software packages (Version 5.2.0.R, SILVACO, 1999).
-
-
-
-
22
-
-
0040518511
-
-
edited by E. Burstein and S. Lundquist Plenum, New York
-
E. O. Kane and E. I. Blount, in Tunneling Phenomena in Solids, edited by E. Burstein and S. Lundquist (Plenum, New York, 1969), pp. 79-91.
-
(1969)
Tunneling Phenomena in Solids
, pp. 79-91
-
-
Kane, E.O.1
Blount, E.I.2
-
25
-
-
0033900449
-
-
E. Suzuki, K. Ishii, S. Kanemaru, T. Maeda, T. Tsutsumi, T. Sekigawa, K. Nagai, and H. Hiroshima, IEEE Trans. Electron Devices 47, 354 (2000).
-
(2000)
IEEE Trans. Electron Devices
, vol.47
, pp. 354
-
-
Suzuki, E.1
Ishii, K.2
Kanemaru, S.3
Maeda, T.4
Tsutsumi, T.5
Sekigawa, T.6
Nagai, K.7
Hiroshima, H.8
-
26
-
-
1842620939
-
-
edited by S. Luryi, J. M. Xu, and A. Zaslavsky Wiley-Interscience, New York
-
D. Esseni, C. Fiegna, and M. Mastrapasqua, in Future Trends in Microelectronics: The Nano Millennium, edited by S. Luryi, J. M. Xu, and A. Zaslavsky (Wiley-Interscience, New York, 2002), pp. 63-78.
-
(2002)
Future Trends in Microelectronics: The Nano Millennium
, pp. 63-78
-
-
Esseni, D.1
Fiegna, C.2
Mastrapasqua, M.3
-
27
-
-
0038546631
-
-
T. Ernst, S. Cristoloveanu, G. Ghibaudo, T. Ouisse, S. Horiguchi, Y. Ono, Y. Takahashi, and K. Murase, IEEE Trans. Electron Devices 50, 830 (2003).
-
(2003)
IEEE Trans. Electron Devices
, vol.50
, pp. 830
-
-
Ernst, T.1
Cristoloveanu, S.2
Ghibaudo, G.3
Ouisse, T.4
Horiguchi, S.5
Ono, Y.6
Takahashi, Y.7
Murase, K.8
-
28
-
-
0041780657
-
-
A. Zaslavsky, C. Aydin, S. Luryi, S. Cristoloveanu, D. Mariolle, D. Fraboulet, and S. Deleonibus, Appl. Phys. Lett. 83, 1653 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.83
, pp. 1653
-
-
Zaslavsky, A.1
Aydin, C.2
Luryi, S.3
Cristoloveanu, S.4
Mariolle, D.5
Fraboulet, D.6
Deleonibus, S.7
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