Contrast inversion in non-contact Dynamic Scanning Force Microscopy: What is high and what is low?

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 789-800

  Palacios Lidon E ^a   Munuera, C ^b,c   Ocal, C ^b   Colchero, J ^a  

^a UNIVERSITY OF MURCIA   (Spain)

^b INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Organic monolayers; Scanning probe microscopy; Scanning probe spectroscopy; Tip sample interaction

Indexed keywords

ALKANETHIOLS; AMBIENT CONDITIONS; EXTREME CASE; HEIGHT MEASUREMENT; MODEL SYSTEM; NON-CONTACT DYNAMICS; ORGANIC MONOLAYERS; SCANNING PROBE SPECTROSCOPY; SPECTROSCOPY MEASUREMENTS; TIP-SAMPLE INTERACTION;

MONOLAYERS; PROBES; SCANNING PROBE MICROSCOPY; SCANNING TUNNELING MICROSCOPY;

SCANNING;

ALKANE;

ARTICLE; CHEMICAL COMPOSITION; CONTRAST ENHANCEMENT; ELECTRONICS; HYDROPHILICITY; IMAGE ANALYSIS; OSCILLATION; SCANNING FORCE MICROSCOPY; THREE DIMENSIONAL IMAGING; TOPOGRAPHY;

EID: 77953536165     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.01.015     Document Type: Article

References (42)

1. Binnig G., Quate C.F., Gerber C. Atomic force microscope. Phys. Rev. Lett. 1986, 56:930-933.
2. Carpick R.W., Salmeron M. Scratching the surface: fundamental investigations of tribology with atomic force microscopy. Chem. Rev. 1997, 97:1163-1194.
3. Xie X.N., Chung H.J., Sow C.H., Wee A.T.S. Nanoscale materials patterning and engineering by atomic force microscopy nanolithography. Mater. Sci. Eng. R 2006, 54(1):1-48.
4. Sugimoto Y., Pou P., Abe M., Jelinek P., Perez R., Morita S., Custance O. Chemical identification of individual surface atoms by atomic force microscopy. Nature 2007, 446:64-67.
5. Zhong Q., Inniss D., Kjoller K., Elings V.B. Fractured polymer silica fiber surface studied by tapping mode atomic-force microscopy. Surf. Sci. 1993, 290:L688-L692.
6. Dai G., Koenders L., Pohlenz F., Dziomba T., Danzebrink H.U. Accurate and traceable calibration of one-dimensional gratings. Meas. Sci. Technol. 2005, 16:1241-1249.
7. Van Noort S.J.T., Van der Werf K.O., De Grooth B.G., Van Hulst N.F., Greve J. Height anomalies in tapping mode atomic force microscopy in air caused by adhesion. Ultramicroscopy 1997, 69:117-127.
8. Ebenstein Y., Nahum E., Banin U. Tapping mode atomic force microscopy for nanoparticles sizing: tip-sample interaction effects. Nanoletters 2002, 2:945-950.
9. Knoll A., Magerle R., Krausch G. Tapping mode atomic force microscopy on polymers: where is the true sample surface?. Macromolecules 2001, 34:4159-4165.
10. Pickering J.P., Vancso G.J. Apparent contrast reversal in tapping mode atomic force microscope images on films of polystyrene-b-polyisoprene-b-polystyrene. Polymer Bull. 1998, 40:549-554.
11. Round A.N., Miles M.J. Exploring the consequences of attractive and repulsive interaction regimes in tapping mode atomic force microscopy of DNA. Nanotechnology 2004, 15:176-183.
12. Kuhle A., Sorensen A.H., Zandbergen J.B., Bohr J. Contrast artifacts in tapping tip atomic force microscopy. Appl. Phys. A 1998, 66:329-332.
13. Neves B.R.A., Leonard D.N., Salmon M.E., Russell P.E., Troughton E.B. Observation of topography inversion in atomic force microscopy of self-assembled monolayers. Nanotechnology 1999, 10:399-404.
14. Fritz M., Radmacher M., Cleveland J.P., Allersma M.W., Stewart R.J., Gieselmann R., Janmey P., Schmidt C.F., Hansma P.K. Imaging globular and filamentous proteins in physiological buffer solutions with tapping mode atomic-force microscopy. Langmuir 1995, 11:3529-3535.
15. San Paulo A., García R. High-resolution imaging of antibodies by tapping-mode atomic force microscopy: attractive and repulsive tip-sample interaction regimes. Biophys. J. 2000, 78:1599-1605.
16. Sadewasser S., Lux-Steiner M.C. Correct height measurement in noncontact atomic force microscopy. Phys. Rev. Lett. 2003, 91:266101.
17. Sadewasser S., Carl P P., Glatzel T., Lux-Steiner M.C. Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy. Nanotechnology 2004, 15:14-18.
18. Spatz J.P., Sheiko S., Moller M., Winkler R.G., Reineker P., Marti O. Tapping scanning force microscopy in air-theory and experiment. Langmuir 1997, 13:4699-4703.
19. Palacios-Lidon E., Perz-Garcia B., Colchero J. Enhancing dynamic scanning force microscopy in air: as close as possible. Nanotechnology 2009, 20:085707.
20. Barrena E., Ocal C., Salmeron M. Molecular packing changes of alkanethiols monolayers on Au(111) under applied pressure. J. Chem. Phys. 2000, 113:2413-2418.
21. Barrena E., Palacios-Lidon E., Munuera C., Torrelles X., Ferrer S., Jonas U., Salmeron M., Ocal C. The role of intermolecular and molecule-substrate interactions in the stability of alkanethiol nonsaturated phases on Au(111). J. Am. Chem. Soc. 2004, 126:385-395.
22. Barrena E., Ocal C., Salmeron M. Structure and stability of tilted-chain phases of alkanethiols on Au(111). J. Chem. Phys. 2001, 114:4210-4214.
23. Munuera C., Barrena E., Ocal C. Chain-length dependence of metastable striped structures of alkanethiols on Au(111). Langmuir 2005, 21:8270-8277.
24. Nanotec Electronica, http://www.nanotec.es.
25. Horcas I., Fernandez R., Gomez-Rodriguez J.M., Colchero J., Gomez-Herrero J., Baro A.M. WSXM: a software for scanning probe microscopy and a tool for nanotechnology. Rev. Sci. Inst. 2007, 78:013705.
26. de Pablo P.J., Colchero J., Gómez-Herrero J., Baro A.M. Jumping mode scanning force microscopy. Appl. Phys. Lett. 1998, 73:3300-3302.
27. Gómez-Navarro C., Gil A., Álvarez M., De Pablo P.J., Moreno-Herrero F., Horcas I., Fernández R., Colchero J., Gómez-Herrero J., Baró A.M. Scanning force microscopy three-dimensional modes applied to the study of the dielectric response of adsorbed DNA molecules. Nanotechnology 2002, 13:314-317.
28. Palacios-Lidon E., Colchero J. Quantitative analysis of tip-sample interaction in non-contact scanning force spectroscopy. Nanotechnology 2006, 17:5491-5500.
29. Strus M.C., Raman A., Han C.-S., Nguyen C.V. Imaging artefacts in atomic force microscopy with carbon nanotube tips. Nanotechnology 2005, 16:2482-2492.
30. García R., San Paulo A. Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy. Phys. Rev. B 1999, 60:4961-4967.
31. Giessibl F.J. Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Phys. Rev. B 1997, 56:16010-16015.
32. Zitzler L., Herminghaus S., Mugele F. Capillary forces in tapping mode atomic force microscopy. Phys. Rev. B 2002, 66:155436.
33. Israelachvili J. Intermolecular and Surface Forces 1991, Academic Press, London.
34. Luna M., Colchero J., Baró A.M. Intermittent contact scanning force microscopy: the role of the liquid necks. App. Phys. Lett. 1998, 72:3461-3463.
35. Colchero J., Storch A., Luna M., Gómez Herrero J., Baró A. Observation of liquid neck formation with scanning force microscopy techniques. Langmuir 1998, 14:2230-2234.
36. Colchero J., Gil A., de Pablo P.J., Luna M., Gómez Herrero J., Baró A.M. Fundamentals of Tribology and Bridging the Gap between the Macro- and Micro/Nanoscales, Nato Science Series II 2001, vol. 10. Kluver Academic Publishers.
37. Sahagún E., García-Mochales P., Sacha G.M., Saénz J.J. Energy dissipation due to capillary interactions: hydrophobicity maps in force microscopy. Phys. Rev. Lett. 2007, 98:176106.
38. Nony L., Cohen-Bouhacina T., Aimè J.-P. Dissipation induced by attractive interaction in dynamic force microscopy: contribution of adsorbed water layers. Surf. Sci. 2002, 499:152-160.
39. Albrecht T.R., Grütter P., Horne D., Rugar D. Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J. Appl. Phys. 1991, 69:668-673.
40. Dürig U. Interaction sensing in dynamic force microscopy. N. J. Phys. 2000, 2:1.
41. García R., Pérez R. Dynamic atomic force microscopy methods. Surf. Sci. Rep. 2002, 47:197-301.
42. Giessibl F.J. Advances in atomic force microscopy. Rev. Mod. Phys. 2003, 75:949-983.