Scanning force microscopy three-dimensional modes applied to the study of the dielectric response of adsorbed DNA molecules

Nanotechnology

Volumn 13, Issue 3, 2002, Pages 314-317

  Gomez Navarro C ^a   Gil, A ^a,c   Alvarez M ^a,d   De Pablo, P J ^a,e   Moreno Herrero, F ^a   Horcas, I ^a   Fernandez Sanchez R ^b   Colchero, J ^a   Gomez Herrero J ^a   Baro A M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b Nanotec Electrónica   (Spain)

^c CMP Cientifica   (Spain)

^d INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

^e VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; DNA; ELECTRIC CURRENTS; ELECTROSTATICS; MICROSCOPIC EXAMINATION; PERMITTIVITY;

SCANNING PROBE MICROSCOPY (SPM);

NANOTECHNOLOGY;

EID: 0036609539     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/13/3/315     Document Type: Conference Paper

References (17)