Tapping Mode Atomic Force Microscopy for Nanoparticle Sizing: Tip-Sample Interaction Effects

Nano Letters

Volumn 2, Issue 9, 2002, Pages 945-950

  Ebenstein, Yuval ^a   Nahum, Eyal ^a   Banin, Uri ^a  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141570617     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl025673p     Document Type: Article

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23. Data may be viewed in the Supporting Information section.
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