메뉴 건너뛰기




Volumn 9, Issue 5, 2009, Pages 1830-1834

Scalable approach for vertical device integration of epitaxial nanowires

Author keywords

[No Author keywords available]

Indexed keywords

AIR-BRIDGE STRUCTURE; AIR-BRIDGES; BOTTOM UP APPROACH; CONVENTIONAL PHOTOLITHOGRAPHY; INDUSTRIAL SCALE; METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR; NANO DEVICE; SCALABLE APPROACH; SELF ALIGNED PROCESS; SILICON-ON-INSULATOR SUBSTRATES; SIMPLIFIED INTEGRATION; TOPDOWN; VAPOR-LIQUID-SOLID; VERTICAL DEVICE INTEGRATION; VERTICAL INTEGRATION; VERTICAL MOSFETS;

EID: 66449112162     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl803776a     Document Type: Article
Times cited : (20)

References (44)
  • 11
    • 20444473152 scopus 로고    scopus 로고
    • K onenkamp, R.; Word, R. C.; Schlegel, C. Appl. Phys. Lett. 2004, 85, 6004.
    • K onenkamp, R.; Word, R. C.; Schlegel, C. Appl. Phys. Lett. 2004, 85, 6004.
  • 13
    • 66449091265 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors 2005. http://www.itrs.net.
    • (2005)
  • 30
    • 0037912948 scopus 로고    scopus 로고
    • Westwater, J; Gosain, D P; Tomiya, S; Usui, S; Ruda H, J. Vac. Sci.Technol. B 1997, 15, 554.
    • Westwater, J; Gosain, D P; Tomiya, S; Usui, S; Ruda H, J. Vac. Sci.Technol. B 1997, 15, 554.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.