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Volumn 78, Issue 20, 2008, Pages

Interface structure of epitaxial graphene grown on 4H-SiC(0001)

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Indexed keywords


EID: 57149122586     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.205424     Document Type: Article
Times cited : (98)

References (66)
  • 1
    • 57149130181 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors Emerging Research Materials
    • International Technology Roadmap for Semiconductors Emerging Research Materials, 2007 (unpublished), p. 5.
    • (2007) , pp. 5
  • 24
    • 0029327275 scopus 로고
    • 10.1016/0039-6028(95)00427-0
    • F. Owman and P. Mårtensson, Surf. Sci. 330, L639 (1995). 10.1016/0039-6028(95)00427-0
    • (1995) Surf. Sci. , vol.330 , pp. 639
    • Owman, F.1    Mårtensson, P.2
  • 26
    • 0030149836 scopus 로고    scopus 로고
    • 10.1016/0039-6028(95)01355-5
    • L. Li and I. S. T. Tsong, Surf. Sci. 351, 141 (1996). 10.1016/0039-6028(95)01355-5
    • (1996) Surf. Sci. , vol.351 , pp. 141
    • Li, L.1    Tsong, I.S.T.2
  • 39
    • 33144460582 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.73.045330
    • W. J. Ong and E. S. Tok, Phys. Rev. B 73, 045330 (2006). 10.1103/PhysRevB.73.045330
    • (2006) Phys. Rev. B , vol.73 , pp. 045330
    • Ong, W.J.1    Tok, E.S.2
  • 42
  • 43
    • 57149144037 scopus 로고    scopus 로고
    • Cree Inc., 4600 Silicon Drive, Durham, NC 27703.
    • Cree Inc., 4600 Silicon Drive, Durham, NC 27703.
  • 45
    • 36149028236 scopus 로고
    • 10.1103/PhysRev.100.544
    • Y. Baskin and L. Mayer, Phys. Rev. 100, 544 (1955). 10.1103/PhysRev.100. 544
    • (1955) Phys. Rev. , vol.100 , pp. 544
    • Baskin, Y.1    Mayer, L.2
  • 47
    • 0000669265 scopus 로고
    • edited by G. S. Brown and D. E. Moncton (North-Holland, Amsterdam
    • I. K. Robinson, in Handbook on Synchrotron Radiation, edited by, G. S. Brown, and, D. E. Moncton, (North-Holland, Amsterdam, 1991), Vol. 3, p. 221.
    • (1991) Handbook on Synchrotron Radiation , vol.3 , pp. 221
    • Robinson, I.K.1
  • 48
    • 0001739444 scopus 로고    scopus 로고
    • E. Vlieg, 10.1107/S0021889897002537
    • E. Vlieg,, J. Appl. Crystallogr. 30, 532 (1997). 10.1107/ S0021889897002537
    • (1997) J. Appl. Crystallogr. , vol.30 , pp. 532
  • 49
    • 57149134136 scopus 로고    scopus 로고
    • Ph.D. thesis, Georgia Institute of Technology
    • R. Feng, Ph.D. thesis, Georgia Institute of Technology, 2006.
    • (2006)
    • Feng, R.1
  • 52
    • 0000000474 scopus 로고
    • 10.1103/PhysRevB.33.3830
    • I. K. Robinson, Phys. Rev. B 33, 3830 (1986). 10.1103/PhysRevB.33.3830
    • (1986) Phys. Rev. B , vol.33 , pp. 3830
    • Robinson, I.K.1
  • 59
    • 57149126593 scopus 로고    scopus 로고
    • Emtsev (Ref.) also carried out XPS measurements on this surface, but they suggest that the 63 interface is all carbon. However, they have not published Si2p core-level spectra to confirm this assertion.
    • Emtsev1
  • 66
    • 57149142552 scopus 로고    scopus 로고
    • Ph.D. thesis, Georgia Institute of Technology
    • T. Li, Ph.D. thesis, Georgia Institute of Technology, 2006.
    • (2006)
    • Li, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.