Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 7, 2008, Pages

  Hibino, H ^a   Kageshima, H ^a   Maeda, F ^a   Nagase, M ^a   Kobayashi, Y ^a   Yamaguchi, H ^a  

^a NTT Basic Research Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 40949096840     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.075413     Document Type: Article

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