Initial stages of the graphite-sic(0001) interface formation studied by photoelectron spectroscopy

Materials Science Forum

Volumn 556-557, Issue , 2007, Pages 525-528

  Emtsev, K V ^a   Seyller, Th ^a   Speck, F ^a   Ley, L ^a   Stojanov, P ^b   Riley, J D ^b   Leckey, R G C ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b LA TROBE UNIVERSITY   (Australia)

Author keywords

Graphite; Interface; Photoelectron spectroscopy; Reconstruction; XPS

Indexed keywords

ELECTRONIC STRUCTURE; GRAPHENE; GRAPHITIZATION; IMAGE RECONSTRUCTION; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SILICON CARBIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURES; ATOMIC ARRANGEMENT; CARBON ATOMS; CORE-LEVEL SPECTRA; GRAPHITE FILMS; HIGH RESOLUTION; INTERFACE FORMATION; RECONSTRUCTED SURFACES;

GRAPHITE;

EID: 34547556392     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.556-557.525     Document Type: Conference Paper

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