Synthesis and characterization of atomically thin graphite films on a silicon carbide substrate

Journal of Physics and Chemistry of Solids

Volumn 67, Issue 9-10, 2006, Pages 2172-2177

  Rollings, E ^a   Gweon, G H ^a   Zhou, S Y ^a   Mun, B S ^b   McChesney, J L ^b   Hussain, B S ^b   Fedorov, A V ^b   First, P N ^c   de Heer, W A ^c   Lanzara, A ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAPHITE THIN FILMS; SILICON CARBIDE SUBSTRATE; SINGLE CRYSTALLINE FILMS; ULTRAHIGH VACUUM (UHV) CONDITIONS;

SILICON CARBIDE;

EID: 33748146502     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.05.010     Document Type: Article

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