Scanning tunneling spectroscopy of inhomogeneous electronic structure in monolayer and bilayer graphene on SiC

Applied Physics Letters

Volumn 91, Issue 12, 2007, Pages

  Brar, Victor W ^a,b   Zhang, Yuanbo ^e   Yayon, Yossi ^e   Ohta, Taisuke ^b,c   McChesney, Jessica L ^b,d   Bostwick, Aaron ^b   Rotenberg, Eli ^b   Horn, Karsten ^c   Crommie, Michael F ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^d MONTANA STATE UNIVERSITY   (United States)

^e Montana State University ^*

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRONIC STRUCTURE; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; SPECTROSCOPIC ANALYSIS;

ATOMIC-SCALE CARBON NETWORKS; GAPLIKE FEATURES; SPATIAL INHOMOGENEITY; TOPOGRAPHIC IMAGES;

GRAPHITE;

EID: 34648822095     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2771084     Document Type: Article

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