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Volumn 90, Issue 25, 2007, Pages

Field effect in epitaxial graphene on a silicon carbide substrate

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EFFECT MOBILITY; GOLD ELECTRODES; GRAPHENE;

EID: 34547344548     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2749839     Document Type: Article
Times cited : (142)

References (16)
  • 10
    • 33746520065 scopus 로고    scopus 로고
    • 2 area), and in the analysis such layers are located 0.34 nm consecutively above the upper Si plane of the final SiC bilayer.
    • 2 area), and in the analysis such layers are located 0.34 nm consecutively above the upper Si plane of the final SiC bilayer.
  • 14
    • 84858099255 scopus 로고    scopus 로고
    • The dielectric constant was assumed to be 2.7 to calculate thickness from unit area capacitance. The measured ellipsometry data are Δ = 98.37° ± 0.15° and ψ = 22.13° ± 0.12°, in a region where determination of the refractive index is uncertain. The wavelength is 6328 Å and the incident angle is 70°. Assuming a refractive index of 1.597, a thickness of 529.5 nm (a base thickness of 39.5 nm and 2 cycles of 245.0 nm) yields the least root sum square error of 1.95° at Δ = 97.62° and ψ = 20.33°. For polystyrene dielectric constant and refractive index values, see, for example, L. V. Gregor, IBM J. Res. Dev. 12, 140 (1968).
    • The dielectric constant was assumed to be 2.7 to calculate thickness from unit area capacitance. The measured ellipsometry data are Δ = 98.37° ± 0.15° and ψ = 22.13° ± 0.12°, in a region where determination of the refractive index is uncertain. The wavelength is 6328 Å and the incident angle is 70°. Assuming a refractive index of 1.597, a thickness of 529.5 nm (a base thickness of 39.5 nm and 2 cycles of 245.0 nm) yields the least root sum square error of 1.95° at Δ = 97.62° and ψ = 20.33°. For polystyrene dielectric constant and refractive index values, see, for example, L. V. Gregor, IBM J. Res. Dev. 12, 140 (1968).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.