Structural properties of the multilayer graphene/ 4H-SiC (000 1̄) system as determined by surface x-ray diffraction

Physical Review B - Condensed Matter and Materials Physics

Volumn 75, Issue 21, 2007, Pages

  Hass, J ^a   Feng, R ^a   Millan Otoya J E ^a   Li, X ^a   Sprinkle, M ^a   First, P N ^a   De Heer, W A ^a   Conrad, E H ^a   Berger, C ^a,b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34347343877     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.214109     Document Type: Article

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