Integrated Intensities Using a Six-Circle Surface X-ray Diffractometer

Journal of Applied Crystallography

Volumn 30, Issue 5, 1997, Pages 532-543

  Vlieg, Elias ^a  

^a FOM INSTITUTE AMOLF   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001739444     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897002537     Document Type: Article

References (16)

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13. Veron, M.-B. (1996). PhD thesis, Université Pierre et Marie Curie, Paris, France.
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