Polychromatic X-ray microdiffraction studies of mesoscale structure and dynamics

Journal of Synchrotron Radiation

Volumn 12, Issue 2, 2005, Pages 155-162

  Ice, G E ^a   Larson, B C ^a   Yang, W ^a   Budai, J D ^a   Tischler, J Z ^a   Pang, J W L ^a   Barabash, R I ^a   Liu, W ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Deformation; Grain boundary type; Grain growth; Strain

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DEFORMATION; GRAIN BOUNDARIES; GRAIN GROWTH; MORPHOLOGY;

ANGULAR RESOLUTION; MONOCHROMATIC MEASUREMENT; PLASTIC STRAIN; X-RAY MICRODIFFRACTION;

X RAY DIFFRACTION;

EID: 27644494726     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049504026949     Document Type: Conference Paper

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