High-Resolution Three-Dimensional X-Ray Microscopy

MRS Bulletin

Volumn 29, Issue 3, 2004, Pages 152-154

  Larson, Bennett C ^a   Lengeler, Bruno ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Microbeams; Microstructure; Three dimensional x ray microscopy; Tomography; X ray optics

Indexed keywords

CHARGE COUPLED DEVICES; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRON MICROSCOPY; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; TOMOGRAPHY; X RAY DIFFRACTION ANALYSIS;

MICROBEAMS; THREE-DIMENSIONAL X-RAY MICROSCOPY;

X RAY OPTICS;

EID: 1642603941     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2004.52     Document Type: Review

References (5)

1. F.J. Humphreys, J. Mater. Sci. 36 (2001) p. 3833.
2. G. Schmahl, Synchrotron Radiation News 16 (2003) p. 2.
3. A. Needleman, Acta Mater. 48 (2000) p. 105.
4. A. Marchesini, H.N. Chapman, S.P. Hau-Riege, R.A. London, A. Scoke, M. He, M.R. Howells, H. Padmore, R. Rosen, J.C.H. Spence, and U. Weierstall, Opt. Express 11 (2003) p. 2344.
5. J. M. Zuo, I. Vartanyants, M. Gao, R. Zhang, and L. A. Nagahara, Science 300 (2003) p. 1419.