Structural visualization of polarization fatigue in epitaxial ferroelectric oxide devices

Nature Materials

Volumn 3, Issue 6, 2004, Pages 365-369

  Do, Dal Hyun ^a   Evans, Paul G ^a   Isaacs, Eric D ^b,d   Kim, Dong Min ^a   Eom, Chang Beom ^a   Dufresne, Eric M ^c  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELECTRODES; POLARIZATION; RANDOM ACCESS STORAGE; SURFACE TOPOGRAPHY; THIN FILMS; VISUALIZATION; X RAY DIFFRACTION;

ELECTRODE LAYERS; X-RAY MICRODIFFRACTIONS; X-RAY REFLECTIONS; X-RAY TOPOGRAPHY;

FERROELECTRIC MATERIALS;

EID: 2942552577     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1122     Document Type: Article

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