Synchrotron x-ray microscopy studies on electromigration of a two-phase material

Journal of Applied Physics

Volumn 102, Issue 5, 2007, Pages

  Lee, A ^a   Liu, W ^b   Ho, C E ^a   Subramanian, K N ^a  

^a Michigan State University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; CURRENT DENSITY; ELECTROMIGRATION; JOULE HEATING; MICROELECTRONICS; MICROSTRUCTURAL EVOLUTION; X RAY ANALYSIS;

MULTIPHASE ALLOYS; SINGLE PHASE MATERIALS; SYNCHROTRON X-RAY MICROSCOPY;

CONDUCTIVE MATERIALS;

EID: 34548653061     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2777122     Document Type: Article

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