X-ray microdiffraction imaging investigations of wing tilt in epitaxially overgrown GaN

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 7, 2006, Pages 1733-1738

  Lubbert D ^a,b   Mikulík, Petr ^c   Pernot, Petra ^a,d   Helfen, Lukas ^a,d   Craven, Michael D ^e   Keller, Stacia ^e   DenBaars, Steven ^e   Baumbach, Tilo ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

^c MASARYK UNIVERSITY   (Czech Republic)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL QUALITY; CRYSTALLINE PERFECTION; EPITAXIALLY LATERALLY OVERGROWN (ELO); MICRODIFFRACTION;

CRYSTAL ORIENTATION; EPITAXIAL GROWTH; MICROMETERS; X RAY DIFFRACTION;

GALLIUM NITRIDE;

EID: 33745013410     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200565251     Document Type: Article

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