Quantitative electrostatic force microscopy on heterogeneous nanoscale samples

Applied Physics Letters

Volumn 87, Issue 15, 2005, Pages 1-3

  Palacios Lidon E ^a   Abellan J ^a   Colchero, J ^a   Munuera, C ^b   Ocal, C ^b  

^a Ulniversidad de Murcia   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; SELF ASSEMBLY;

ELECTROSTATIC FORCE MICROSCOPY; SIGNAL SOURCE;

ELECTROSTATICS;

EID: 28344454651     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2099527     Document Type: Article

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