Dynamic variations in adhesion of self-assembled monolayers on nanoasperities probed by atomic force microscopy

Scanning

Volumn 30, Issue 2, 2008, Pages 106-117

  Xu, Chang ^a   Jones, Ryan L ^b   Batteas, James D ^b  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Asperities; Nanotribology; Self assembled monolayers

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; FORCE MEASUREMENT; FRICTION; SELF ASSEMBLED MONOLAYERS; SURFACE ROUGHNESS;

FORCE-DISTANCE SPECTROSCOPY; OCTADECYLTRIETHOXYSILANE (OTE); SILICON OXIDE;

NANOTRIBOLOGY;

SILANE DERIVATIVE; SILICON DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; NANOTECHNOLOGY; PRIORITY JOURNAL; STRUCTURE ANALYSIS;

EID: 42349107286     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.20095     Document Type: Article

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