Frictional force microscopy of oxidized polystyrene surfaces measured using chemically modified probe tips

Langmuir

Volumn 16, Issue 11, 2000, Pages 5054-5058

  Ton That, C ^a   Campbell, P A ^a   Bradley, R H ^a  

^a ROBERT GORDON UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; CHEMICAL MODIFICATION; CHEMISORPTION; FRICTION; PROBES; SURFACE MEASUREMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

FRICTIONAL FORCE MICROSCOPY; FRICTIONAL PROPERTIES; FUNCTIONAL GROUP CHEMISTRY;

POLYSTYRENES;

EID: 0033731771     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9908586     Document Type: Article

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