Chemical modification of the SPM tips for nanoprobing functional surfaces

American Chemical Society, Polymer Preprints, Division of Polymer Chemistry

Volumn 37, Issue 2, 1996, Pages 575-576

  Tsukruk, Vladimir V ^a   Bliznyuk, Valery N ^b   Wu, John ^a   Visser, Dale W ^a  

^a Parkview Campus   (United States)

^b INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL MODIFICATION; COATINGS; CONTACT ANGLE; GOLD; SILANES; SILICON; SILICON NITRIDE;

CHEMICAL FORCE MICROSCOPY (CFM); SCANNING PROBE MICROSCOPY (SPM) TIPS;

SURFACE PROPERTIES;

EID: 3242829151     PISSN: 00323934     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)

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