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Chimia

Volumn 60, Issue 11, 2006, Pages 735-741

Preparative methods for nanoanalysis of materials with focused ion beam instruments

(3) Nellen, Philipp M a Callegari, Victor a Sennhauser, Urs a

a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY (Switzerland)

Author keywords

Focused ion beam; Nanoanalysis; Preparative tool

Indexed keywords

EID: 33845614843 PISSN: 00094293 EISSN: None Source Type: Journal
DOI: 10.2533/chimia.2006.735 Document Type: Review

Times cited : (12)

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