Improving the lateral resolution of the MFM technique to the 10 nm range

Journal of Magnetism and Magnetic Materials

Volumn 272-276, Issue III, 2004, Pages 2138-2140

  Koblischka, M R ^a   Hartmann, U ^a   Sulzbach, T ^b  

^a SAARLAND UNIVERSITY   (Germany)

^b NANOWORLD SERVICES GMBH   (Germany)

Author keywords

MFM imaging; Preparation of tips; Resolution; Soft magnetic sample

Indexed keywords

ASPECT RATIO; ELECTRON BEAMS; HARD DISK STORAGE; MAGNETIC PROPERTIES; PERTURBATION TECHNIQUES; ULTRAHIGH VACUUM;

ELECTRON BEAM DEPOSITION; MAGNETIC FORCE MICROSCOPY (MFM) IMAGING; PREPARATION OF TIPS; SOFT MAGNETIC SAMPLES;

SOFT MAGNETIC MATERIALS;

EID: 23044440471     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2004.01.030     Document Type: Conference Paper

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