Cantilever tip probe arrays for simultaneous SECM and AFM analysis

Sensors and Actuators, B: Chemical

Volumn 108, Issue 1-2 SPEC. ISS., 2005, Pages 964-972

  Fasching, Rainer J ^a   Tao, Ye ^a   Prinz, Fritz B ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

AFM; FIB; Nano electrodes; SECM; Tip probe array

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRODES; PLATINUM; POLYMERS; SPATIAL VARIABLES MEASUREMENT; SURFACE REACTIONS; TRANSDUCERS;

AFM; FIB; NANO ELECTRODES; SECM; TIP PROBE ARRAYS;

ARRAYS;

EID: 19744364811     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2004.10.058     Document Type: Conference Paper

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