Force microscopy experiments with ultrasensitive cantilevers

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Rast, S ^a   Gysin, U ^a   Ruff, P ^a   Gerber, Ch ^a   Meyer, E ^a   Lee, D W ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b Chonnam National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLINE MATERIALS; MAGNETIC PROPERTIES; SENSITIVITY ANALYSIS; SINGLE CRYSTALS; SUPERCONDUCTIVITY; ULTRAHIGH VACUUM;

ATTONEWTON SENSITIVITY; PENDULUM GEOMETRY; SUPERCONDUCTIVE PARTICLES; ULTRASENSITIVE CANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 33644969673     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S15     Document Type: Article

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