-
4
-
-
0037230485
-
-
M. Fritze, C.K. Chen, D.K. Astolfi, D.R. Yost, J.A. Burns, C.-L. Chen, P.M. Gouker, V. Suntharalingam, P.W. Wyatt, and C.L. Keast, IEEE Circuits and Devices Magazine 19 (1) (2003) p. 43.
-
(2003)
IEEE Circuits and Devices Magazine
, vol.19
, Issue.1
, pp. 43
-
-
Fritze, M.1
Chen, C.K.2
Astolfi, D.K.3
Yost, D.R.4
Burns, J.A.5
Chen, C.-L.6
Gouker, P.M.7
Suntharalingam, V.8
Wyatt, P.W.9
Keast, C.L.10
-
5
-
-
0141722432
-
-
M. Fritze, R. Mallen, B. Wheeler, D. Yost, J.P. Snyder, B. Kasprowicz, B. Eynon, and H.Y Liu, Proc. SPIE 5040 (2003) p. 327.
-
(2003)
Proc. SPIE
, vol.5040
, pp. 327
-
-
Fritze, M.1
Mallen, R.2
Wheeler, B.3
Yost, D.4
Snyder, J.P.5
Kasprowicz, B.6
Eynon, B.7
Liu, H.Y.8
-
8
-
-
3843062241
-
-
S.-H. Hsu, S.-P. Fang, I.H. Huang, B.S.-M. Lin, and K.-C. Hung, Proc. SPIE 5377 (2004) p. 1214.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 1214
-
-
Hsu, S.-H.1
Fang, S.-P.2
Huang, I.H.3
Lin, B.S.-M.4
Hung, K.-C.5
-
9
-
-
4143150811
-
-
T.M. Bloomstein, M.W. Horn, M. Rothschild, R.R. Kunz, S.T. Palmacci, and R.B. Goodman, J. Vac. Sci. Technol. B 15 (1997) p. 2112.
-
(1997)
J. Vac. Sci. Technol. B
, vol.15
, pp. 2112
-
-
Bloomstein, T.M.1
Horn, M.W.2
Rothschild, M.3
Kunz, R.R.4
Palmacci, S.T.5
Goodman, R.B.6
-
10
-
-
0033263063
-
-
V. Liberman, T.M. Bloomstein, M. Rothschild, J.H.C. Sedlacek, R.S. Uttaro, A.K. Bates, C. Van Peski, and K. Orvek, J. Vac. Sci. Technol. B 17 (1999) p. 3273.
-
(1999)
J. Vac. Sci. Technol. B
, vol.17
, pp. 3273
-
-
Liberman, V.1
Bloomstein, T.M.2
Rothschild, M.3
Sedlacek, J.H.C.4
Uttaro, R.S.5
Bates, A.K.6
Van Peski, C.7
Orvek, K.8
-
12
-
-
3843091536
-
-
G. Grabosch, L. Parthier, P. Kruell, and K. Knapp, Proc. SPIE 5377 (2004) p. 1781.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 1781
-
-
Grabosch, G.1
Parthier, L.2
Kruell, P.3
Knapp, K.4
-
13
-
-
3843106807
-
-
U. Okoroanyanwu, R. Gronheid, J. Coenen, J. Hermans, and K.G. Ronse, Proc. SPIE 5377 (2004) p. 1695.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 1695
-
-
Okoroanyanwu, U.1
Gronheid, R.2
Coenen, J.3
Hermans, J.4
Ronse, K.G.5
-
14
-
-
3843094831
-
-
F.M. Houlihan, R. Sakamuri, A. Romano, D. Rentkiewicz, R. Dammel, W. Conley, D. Miller, M. Sebald, N. Stepanenko, M. Markert, U. Mierau, I. Vermeir, C. Hohle, T. Itani, M. Shigematsu, and E. Kawaguchi, Proc. SPIE 5376 (2004) p. 134.
-
(2004)
Proc. SPIE
, vol.5376
, pp. 134
-
-
Houlihan, F.M.1
Sakamuri, R.2
Romano, A.3
Rentkiewicz, D.4
Dammel, R.5
Conley, W.6
Miller, D.7
Sebald, M.8
Stepanenko, N.9
Markert, M.10
Mierau, U.11
Vermeir, I.12
Hohle, C.13
Itani, T.14
Shigematsu, M.15
Kawaguchi, E.16
-
15
-
-
0141834847
-
-
W. Li, P. Rao Varanasi, M.C. Lawson, R.W. Kwong, K.-J. Chen, H. Ito, H. Truong, R.D. Allen, M. Yamamoto, E. Kobayashi, and M. Slezak, Proc. SPIE 5039 (2003) p. 61.
-
(2003)
Proc. SPIE
, vol.5039
, pp. 61
-
-
Li, W.1
Rao Varanasi, P.2
Lawson, M.C.3
Kwong, R.W.4
Chen, K.-J.5
Ito, H.6
Truong, H.7
Allen, R.D.8
Yamamoto, M.9
Kobayashi, E.10
Slezak, M.11
-
16
-
-
0036413060
-
-
A. Grenville, V. Liberman, M. Rothschild, J.H.C. Sedlacek, R.H. French, R.C. Wheland, X. Zhang, and J. Gordon, Proc. SPIE 4691 (2002) p. 1644.
-
(2002)
Proc. SPIE
, vol.4691
, pp. 1644
-
-
Grenville, A.1
Liberman, V.2
Rothschild, M.3
Sedlacek, J.H.C.4
French, R.H.5
Wheland, R.C.6
Zhang, X.7
Gordon, J.8
-
17
-
-
18644366353
-
-
R. French, R.C. Wheland, W. Qiu, M.F. Lemon, G.S. Blackman, E. Zhang, J. Gordon, V. Liberman, A. Grenville, R.R. Kunz, and M. Rothschild, Proc. SPIE 4691 (2002) p. 576.
-
(2002)
Proc. SPIE
, vol.4691
, pp. 576
-
-
French, R.1
Wheland, R.C.2
Qiu, W.3
Lemon, M.F.4
Blackman, G.S.5
Zhang, E.6
Gordon, J.7
Liberman, V.8
Grenville, A.9
Kunz, R.R.10
Rothschild, M.11
-
21
-
-
3843070846
-
-
S. Owa, H. Nagasaka, Y. Ishii, O. Hirakawa, and T. Yamamoto, Proc. SPIE 5377 (2004) p. 264.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 264
-
-
Owa, S.1
Nagasaka, H.2
Ishii, Y.3
Hirakawa, O.4
Yamamoto, T.5
-
22
-
-
3843124140
-
-
B. Streefkerk, J. Baselmans, W. Gehoel-van Ansem, J. Mulkens, C. Hoogendam, M. Hoogendorp, D. Flagello, H. Sewell, and P. Graeupner, Proc. SPIE 5377 (2004) p. 285.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 285
-
-
Streefkerk, B.1
Baselmans, J.2
Gehoel-Van Ansem, W.3
Mulkens, J.4
Hoogendam, C.5
Hoogendorp, M.6
Flagello, D.7
Sewell, H.8
Graeupner, P.9
-
23
-
-
3843065465
-
-
T. Honda, Y. Kishikawa, T. Tokita, H. Ohsawa, M. Kawashima, A. Ohkubo, M. Yoshii, and A. Suzuki, Proc. SPIE 5377 (2004) p. 319.
-
(2004)
Proc. SPIE
, vol.5377
, pp. 319
-
-
Honda, T.1
Kishikawa, Y.2
Tokita, T.3
Ohsawa, H.4
Kawashima, M.5
Ohkubo, A.6
Yoshii, M.7
Suzuki, A.8
-
24
-
-
3843078452
-
-
W. Hinsberg, G.M. Wallraff, C.E. Larson, B.W. Davis, V. Deline, S. Raoux, D. Miller, F.A. Houle, J. Hoffnagle, M.I. Sanchez, C. Rettner, and L.K. Sundberg, Proc. SPIE 5376 (2004) p. 21.
-
(2004)
Proc. SPIE
, vol.5376
, pp. 21
-
-
Hinsberg, W.1
Wallraff, G.M.2
Larson, C.E.3
Davis, B.W.4
Deline, V.5
Raoux, S.6
Miller, D.7
Houle, F.A.8
Hoffnagle, J.9
Sanchez, M.I.10
Rettner, C.11
Sundberg, L.K.12
-
25
-
-
13244294181
-
-
D. Gil, T. Brunner, C. Fonseca, N. Song, B. Streefkerk, C. Wagner, and M. Stavenga, J. Vac. Sci. Technol. B 22 (2004) p. 3431.
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 3431
-
-
Gil, D.1
Brunner, T.2
Fonseca, C.3
Song, N.4
Streefkerk, B.5
Wagner, C.6
Stavenga, M.7
-
26
-
-
25144478804
-
-
V. Liberman, S.T. Palmacci, D.E. Hardy, M. Rothschild, and A. Grenville, Proc. SPIE 5754 (2005) p. 148.
-
(2005)
Proc. SPIE
, vol.5754
, pp. 148
-
-
Liberman, V.1
Palmacci, S.T.2
Hardy, D.E.3
Rothschild, M.4
Grenville, A.5
-
27
-
-
0036416070
-
-
T. Brunner, N. Seong, W.D. Hinsberg, J.A. Hoffnagle, F.A. Houle, and M.I. Sanchez, Proc. SPIE 4691 (2002) p. 1.
-
(2002)
Proc. SPIE
, vol.4691
, pp. 1
-
-
Brunner, T.1
Seong, N.2
Hinsberg, W.D.3
Hoffnagle, J.A.4
Houle, F.A.5
Sanchez, M.I.6
-
29
-
-
22144436207
-
-
S. Peng, R.H. French, W. Qiu, R.C. Wheland, M. Yang, M.F. Lemon, and M.K. Crawford, Proc. SPIE 5754 (2005) p. 427.
-
(2005)
Proc. SPIE
, vol.5754
, pp. 427
-
-
Peng, S.1
French, R.H.2
Qiu, W.3
Wheland, R.C.4
Yang, M.5
Lemon, M.F.6
Crawford, M.K.7
-
30
-
-
22144469051
-
-
J. Burnett, S.G. Kaplan, E.L. Shirley, P.J. Tompkins, and J.E. Webb, Proc. SPIE 5754 (2005) p. 611.
-
(2005)
Proc. SPIE
, vol.5754
, pp. 611
-
-
Burnett, J.1
Kaplan, S.G.2
Shirley, E.L.3
Tompkins, P.J.4
Webb, J.E.5
-
31
-
-
13244263115
-
-
M. Rothschild, T.M. Bloomstein, R.R. Kunz, V. Liberman, M. Switkes, S.T. Palmacci, J.H.C. Sedlacek, D. Hardy, and A. Grenville, J. Vac. Sci. Technol. B 22 (2004) p. 2877.
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 2877
-
-
Rothschild, M.1
Bloomstein, T.M.2
Kunz, R.R.3
Liberman, V.4
Switkes, M.5
Palmacci, S.T.6
Sedlacek, J.H.C.7
Hardy, D.8
Grenville, A.9
-
32
-
-
13244288117
-
-
R.A. Synowicki, G.K. Pribil, G. Cooney, C.M. Herzinger, S.E. Green, R.H. French, M.K. Yang, J.H. Burnett, and S. Kaplan, J. Vac. Sci. Technol. B 22 (2004) p. 3450.
-
(2004)
J. Vac. Sci. Technol. B
, vol.22
, pp. 3450
-
-
Synowicki, R.A.1
Pribil, G.K.2
Cooney, G.3
Herzinger, C.M.4
Green, S.E.5
French, R.H.6
Yang, M.K.7
Burnett, J.H.8
Kaplan, S.9
-
33
-
-
25144510868
-
-
M. Switkes, T.M. Bloomstein, M. Rothschild, E.W. Arriola, and T.H. Morrison, Proc. SPIE 5754 (2005) p. 237.
-
(2005)
Proc. SPIE
, vol.5754
, pp. 237
-
-
Switkes, M.1
Bloomstein, T.M.2
Rothschild, M.3
Arriola, E.W.4
Morrison, T.H.5
-
34
-
-
0001073455
-
-
A. Yen, E.H. Anderson, R.A. Ghanbari, M.L. Schattenburg, and H.I. Smith, Appl. Opt. 31 (1992) p. 4540.
-
(1992)
Appl. Opt.
, vol.31
, pp. 4540
-
-
Yen, A.1
Anderson, E.H.2
Ghanbari, R.A.3
Schattenburg, M.L.4
Smith, H.I.5
-
35
-
-
0001350659
-
-
T.A. Savas, M.L. Schattenburg, J.M. Carter, and H.I. Smith, J. Vac. Sci. Technol. B 14 (1996) p. 4167.
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 4167
-
-
Savas, T.A.1
Schattenburg, M.L.2
Carter, J.M.3
Smith, H.I.4
-
36
-
-
0033273254
-
-
J.A. Hofnagle, W.D. Hinsberg, M. Sanchez, and F.A. Houle, J. Vac. Sci. Tcchnol. B 17 (1999) p. 3306.
-
(1999)
J. Vac. Sci. Tcchnol. B
, vol.17
, pp. 3306
-
-
Hofnagle, J.A.1
Hinsberg, W.D.2
Sanchez, M.3
Houle, F.A.4
-
39
-
-
33744800582
-
-
T.M. Bloomstein, P.W. Juodawlkis, R.B. Swint, S.G. Cann, S J. Deneault, N.N. Efremow Jr., D.E. Hardy, M.F. Marchant, A. Napoleone, D.C. Oakley, M. Rothschild, and P. Brooker, J. Vac. Sci. Technol. B 23 (2005).
-
(2005)
J. Vac. Sci. Technol. B
, vol.23
-
-
Bloomstein, T.M.1
Juodawlkis, P.W.2
Swint, R.B.3
Cann, S.G.4
Deneault, S.J.5
Efremow Jr., N.N.6
Hardy, D.E.7
Marchant, M.F.8
Napoleone, A.9
Oakley, D.C.10
Rothschild, M.11
Brooker, P.12
-
40
-
-
24644494197
-
-
M. Fritze, B. Tyrrell, T.H. Fedynyshyn, and M. Rothschild, Proc. SPIE 5751 (2005) p. 1058.
-
(2005)
Proc. SPIE
, vol.5751
, pp. 1058
-
-
Fritze, M.1
Tyrrell, B.2
Fedynyshyn, T.H.3
Rothschild, M.4
-
41
-
-
33744826853
-
-
M. Fritze, T.M. Bloomstein, B. Tyrrell, T.H. Fedynyshyn, N.N. Efremow Jr., D.E. Hardy, S. Cann, D. Lennon, S. Spector, and M. Rothschild, J. Vac. Sci. Technol. B 23 (2005).
-
(2005)
J. Vac. Sci. Technol. B
, vol.23
-
-
Fritze, M.1
Bloomstein, T.M.2
Tyrrell, B.3
Fedynyshyn, T.H.4
Efremow Jr., N.N.5
Hardy, D.E.6
Cann, S.7
Lennon, D.8
Spector, S.9
Rothschild, M.10
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