Defect generation under electrical stress: Experimental characterization and modelling

High-K Gate Dielectrics

Volumn , Issue , 2003, Pages 467-495

  Houssa, Michel ^a,b  

^a AIX MARSEILLE UNIVERSITY   (France)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25844469772     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter

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