Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 309-318

  Nigh, Phil ^a   Gattiker, Anne ^b  

^a IBM   (United States)

^b IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOOTPRINT ANALYSIS; GUIDING TEST DECISIONS; IDDQ SIGNATURE ANALYSIS; SYSTEMATIC DEFECT ANALYSIS;

DEFECTS; DEMODULATION; ELECTRIC POTENTIAL; INFORMATION ANALYSIS; MICROPROCESSOR CHIPS; PROBLEM SOLVING;

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS;

EID: 18144367789     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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