Application and analysis of IDDq diagnostic software

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 319-327

  Nigh, Phil ^a   Forlenza, Donato ^a   Motika, Franco ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; DATABASE SYSTEMS; FAILURE ANALYSIS;

SOFTWARE BASED DIAGNOSTIC TOOLS;

INTEGRATED CIRCUIT TESTING;

EID: 0031374044     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)