Current signatures: Application

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 156-165

  Gattiker, Anne E ^a   Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; SPURIOUS SIGNAL NOISE;

CURRENT SIGNATURE BASED TEST METHOD;

INTEGRATED CIRCUIT TESTING;

EID: 0031376341     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)