Neighbor selection for variance reduction in IDDQ and other parametric data

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1240-1246

  Daasch, W Robert ^a   Cota, Kevin ^a   McNames, James ^a   Madge, Robert ^b  

^a Portland State University   (United States)

^b AGERE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NEIGHBOR SELECTION; PROBABILITY DISTRIBUTION FUNCTIONS; VARIANCE REDUCTION;

ELECTRIC CURRENTS; LSI CIRCUITS; PROBABILITY DISTRIBUTIONS; SILICON WAFERS;

INTEGRATED CIRCUIT TESTING;

EID: 0036444846     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2002.1041882     Document Type: Conference Paper

References (6)

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3. C. Thibeault, "A Histogram Based Procedure for Current Testing of Active Defects," Proceedings International Test Conference, pp. 719-723, October, 1999.
4. P. Maxwell, P. O'Neill, R. Aitken, R. Dudley, N. Jaarsma, M. Quach, and D. Wiseman, "Current Ratios: A Self-Scaling Technique for Production IDDQ Testing," Proceedings International Test Conference, pp. 738-746, October 1999.
5. W.C. Riordan, R. Miller, J.M. Sherman, and J. Hicks, "Microprocessor Reliability Performance as a Function of Die Location," IEEE 37th International Reliability Physics Symposium, pp. 1-11, San Diego, CA, 1999.
6. R.A. Richmond, "Successful Implementation of Structured Testing," Proceedings of International Test Conference, pp. 344-348, October 2000.