Optimal conditions for Boolean and current detection of floating gate faults

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 477-486

  Renovell, M ^a   Ivanov, A ^a   Bertrand, Y ^a   Azais, F ^a   Rafiq, S ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BOOLEAN FUNCTIONS; ELECTRIC CURRENTS; ELECTRIC INVERTERS; ELECTRON DEVICE TESTING; MAXIMUM LIKELIHOOD ESTIMATION; OPTIMAL SYSTEMS; SEMICONDUCTOR DEVICE MODELS;

BOOLEAN TEST; FLOATING GATE FAULTS; FLOATING GATE POTENTIAL; TWIN TRANSISTOR STRUCTURE;

GATES (TRANSISTOR);

EID: 0033332914     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)